2025 IEEE Xplore Subscription Options for Organizations

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Research

Access model
IEEE journal titles
IEEE conference titles
Active & selected archival IEEE standards
Partner content
Backfile
Full-text documents
Price
Unlimited full-text access and downloads
210
Access to all IEEE-sponsored annual conference titles
Approx. 5,000
IET conferences and complimentary access to VDE and Bell Labs Technical Journal
Backfile to late 1800s for select titles
More than 6 million
Contact IEEE for a custom quote
*IEL is the only online option to include unlimited access to IET and VDE conference content, and the only non-standards option to include active and archival IEEE standards. Drafts available separately.
 
IEEE All-Society Periodicals Package (ASPP)
 
IEEE Proceedings Order Plan (POP)
 
IEEE Proceedings Order Plan All (POP ALL)
 
IEEE Journals Library Plus
 
IEEE Conference Library Plus
 
IEEE Communications Library
 
IEEE Enterprise
 
IEEE Power & Energy Library
 
 


Archives

Access model
IEEE journal titles
IEEE conference titles
Active & selected archival IEEE standards
Partner content
Backfile
Full-text documents
Price
IEEE Journals Archive
 
IEEE Conference Proceedings Archive
 
 


IEEE Standards

Access model
Active & selected archival IEEE standards
Backfile
Full-text documents
Price
IEEE All-Inclusive Standards Online
 
IEEE Standards Select
 
2023 National Electrical Safety Code® (NESC®)
 
 


eBooks & eLearning

# of titles
Backlist
Full-text documents/ chapters
Price
Artech House eBooks Library
 
IEEE-Wiley eBooks Library
 
Manning eBooks Library
 
MIT Press eBooks Library—Computing & Engineering Collection
 
Now Publishers Foundations and Trends® Technology eBooks Library
 
Packt eBooks Library
 
Princeton University Press eBooks Library
 
River Publishers eBooks Library
 
SAE eBooks Library
 
Wiley Data and Cybersecurity eBooks Library
 
Wiley Semiconductors eBooks Library
 
Wiley Telecommunications eBooks Library
 
IEEE eLearning Library
 
IEEE English for Technical Professionals™
 
 


Additional
Content Partners
in IEEE Xplore

Access Model
Content
Backfile
Full-text documents
Price
MIT Press Journals—Computing & Engineering Collection
 
IBM Journal of Research and Development Archive
 
Bell Labs Technical Journal Archive