Measurement of the amount of chromosome aberration through object detection

Kangsan Kim; Byung-Chul Kim; Sang-Keun Woo

doi:10.1117/12.2654116

3 April 2023 Measurement of the amount of chromosome aberration through object detection

Kangsan Kim, Byung-Chul Kim, Sang-Keun Woo

Proceedings Volume 12464, Medical Imaging 2023: Image Processing; 124642P (2023) https://doi.org/10.1117/12.2654116
Event: SPIE Medical Imaging, 2023, San Diego, California, United States

Conference Poster

Abstract

Nature of the radiation which results in DNA damage is utilized to measure the extent of irradiation by quantification of the chromosome aberration. In this research, we applied You Only Look Once (YOLO), to measure the amount of the chromosome aberration in the chromosome slide automatically, based on the consideration that it requires both of identification and classification of the chromosome aberrations. Among the various models derived from YOLO, we selected YOLOv5. The parameters were updated by the objective function which is calculated as a summation of the complete intersection over union (CIoU) and classification loss. It is trained with the dataset, generated from attaching the single dicentric and normal chromosome images to the chromosome slide which contains only normal chromosome. The proposed model is shown to be localize and classify the chromosomes successfully. In conclusion, we confirmed the applicability of the object detection method for the purpose of measuring the amount of chromosome aberration.

Citation Download Citation

Kangsan Kim, Byung-Chul Kim, and Sang-Keun Woo "Measurement of the amount of chromosome aberration through object detection", Proc. SPIE 12464, Medical Imaging 2023: Image Processing, 124642P (3 April 2023); https://doi.org/10.1117/12.2654116

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