%PDF-1.6
%
1 0 obj
<>stream
application/pdfIEEE2023 International Conference on IC Design and Technology (ICICDT);2023; ; ;10.1109/ICICDT59917.2023.10332279Investigation of Low Temperature Noise and Current Fluctuation for Advanced Transistors: Characterization and ModelingRan Cheng
2023 International Conference on IC Design and Technology (ICICDT)xxvii25 Sept. 202310.1109/ICICDT59917.2023.10332279xxvii
VoR
endstream
endobj
2 0 obj
<>
endobj
3 0 obj
<>
endobj
4 0 obj
<>stream
HW{pW~~\."Hw%"$q
|BeDi
ljKnTwUu*L˪Ū#Ohwfjwgљ9==y x1Jdiseؼ)L+[65Lu
pr:sѹc3j]u{5/cY I>hRFɽWf}=9xL!Ȅ_S0γ5:{1o~[0aVEY\8FiZrLd "VExin"c!Z^fF/ fW*.Oo|<۠a7 m-#Z!2Mt[kߡcՃ?+wBI8(epꐡ҆H~GYK__cEe/