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Built-In-Self-Testing Techniques for Programmable Capacitor Arrays

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Abstract

This paper presents efficient built-in-self-testing (BIST) techniques for programmable capacitor arrays (PCAs) on field programmable analog array (FPAA) platforms. The proposed BIST circuits consist of switched-capacitor (SC) integrators and analog window comparators. Taking advantage of FPAA programmable resources, the proposed PCA BIST circuits can be implemented with very small hardware overhead. Also the impact of comparator threshold variations as well as other circuit parasitic effects on the efficiency of the proposed testing method is investigated. Effective circuit techniques along with new comparator designs are presented to minimize the adverse effect of comparator threshold variations. Finally, procedures for using the proposed BIST method to systematically test all PCAs on an FPAA platform are described and experimental results are presented.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, Southern Illinois University, Carbondale, IL, 62901-6603, USA

    Amit Laknaur, Sai Raghuram Durbha & Haibo Wang

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  1. Amit Laknaur
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  2. Sai Raghuram Durbha
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  3. Haibo Wang
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Correspondence to Amit Laknaur.

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Editor: S. Mir

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Laknaur, A., Durbha, S.R. & Wang, H. Built-In-Self-Testing Techniques for Programmable Capacitor Arrays. J Electron Test 22, 449–462 (2006). https://doi.org/10.1007/s10836-006-9459-9

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  • DOI: https://doi.org/10.1007/s10836-006-9459-9

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