Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis | Computational Statistics Skip to main content
Log in

Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis

  • Original Paper
  • Published:
Computational Statistics Aims and scope Submit manuscript

Abstract

Assuming a beta prior distribution on the fraction defective, \(p\), failure-censored sampling plans for Weibull lifetime models using classical (or average) and Bayesian (or posterior) producer’s and consumer’s risks are designed to determine the acceptability of lots of a given product. The average risk criterion provides a certain assurance that good (bad) lots will be accepted (rejected), whereas the posterior risk criterion provides a determined confidence that an accepted (rejected) lot is indeed good (bad). The performance of classical and Bayesian risks are analyzed in developing sampling plans when the lifetime variable follows the Weibull distribution. Several figures and tables illustrate the sensitivity of the risks and optimal sample sizes for selected censoring levels and specifications according to the available prior information on \(p\). The analysis clarifies the distinction among the different risks for a given sampling plan, and the effect of the prior knowledge on the required sample size. The study shows that, under uncertainty in the prior variance of \(p\), the designs using Bayesian risks are more appropriate.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
¥17,985 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price includes VAT (Japan)

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7

Similar content being viewed by others

References

  • Achcar JA, Louzada Neto F (1992) A Bayesian approach for accelerated life tests considering the Weibull distribution. Comput Stat 7:355–369

    MathSciNet  MATH  Google Scholar 

  • ANSI/ASQC Z1.4 (1993) Sampling Procedures and Tables for Inspection by Attributes. ASQC, Milwaukee

  • Arizono I, Kawamura Y, Takemoto Y (2008) Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data. Eur J Oper Res 189:570–574

    Article  MathSciNet  MATH  Google Scholar 

  • Aslam M, Jun CH, Ahmad M (2009) A group sampling plan based on truncated life test for gamma distributed items. Pak J Stat 25:333–340

    MathSciNet  Google Scholar 

  • Aslam M, Balamurali S, Jun CH, Ahmad M (2010) A two-plan sampling system for life testing under Weibull distribution. Ind Eng Manag Syst 9:54–59

    Google Scholar 

  • Bhattacharyya G (1985) On asymptotics of maximum likelihood and related estimators based on type II censored data. J Am Stat Assoc 80:398–404

    Article  MATH  Google Scholar 

  • Brush GG (1986) A comparison of classical and Bayes producer’s risk. Technometrics 28:69–72

    Article  MATH  Google Scholar 

  • Champernowne DG (1953) The economics of sequential sampling procedure for defectives. Appl Stat 2:118–130

    Article  Google Scholar 

  • Costa Mattos NM, dos Santos Migon H (2001) A Bayesian analysis of reliability in accelerated life tests using Gibbs sampler. Comput Stat 16:299–312

    Article  MATH  Google Scholar 

  • Ebrahimi N, Soofi ES (1990) Relative information loss under type II censored exponential data. Biometrika 77:429–435

    Article  MathSciNet  MATH  Google Scholar 

  • Epstein B (1954) Truncated life test in the exponential case. Ann Math Stat 25:555–564

    Article  MATH  Google Scholar 

  • Epstein B, Sobel M (1953) Life testing. J Am Stat Assoc 48:486–502

    Article  MathSciNet  MATH  Google Scholar 

  • Fernández AJ (2005) Progessively censored variables sampling plans for two-parameter exponential distributions. J Appl Stat 32:823–829

    Article  MathSciNet  MATH  Google Scholar 

  • Fernández AJ (2006) Bounding maximum likelihood estimates based on incomplete ordered data. Comput Stat Data Anal 50:2014–2027

    Article  MATH  Google Scholar 

  • Fernández AJ (2008) Reliability inference and sample-size determination under double censoring for some two-parameter models. Comput Stat Data Anal 52:3426–3440

    Article  MATH  Google Scholar 

  • Fernández AJ (2009) Weibull inference using trimmed samples and prior information. Stat Pap 50:119–136

    Article  MATH  Google Scholar 

  • Fernández AJ (2010a) Tolerance limits for \(k\)-out-of-\(n\) systems with exponentially distributed component lifetimes. IEEE Trans Reliab 59:331–337

    Article  Google Scholar 

  • Fernández AJ (2010b) Two-sided tolerance intervals in the exponential case: corrigenda and generalizations. Comput Stat Data Anal 54:151–162

    Article  Google Scholar 

  • Fernández AJ, Pérez-González CJ (2012a) Optimal acceptance sampling plans for log-location-scale lifetime models using average risk. Comput Stat Data Anal 56:719–731

    Article  MATH  Google Scholar 

  • Fernández AJ, Pérez-González CJ (2012b) Generalized Beta prior models on fraction defective in reliability test planning. J Comput Appl Math 236:3147–3159

    Article  MathSciNet  MATH  Google Scholar 

  • Fernández AJ, Pérez-González CJ, Aslam M, Jun C-H (2011) Design of progressively censored group sampling plans for Weibull distributions: an optimization problem. Eur J Oper Res 211:525–532

    Article  MATH  Google Scholar 

  • Huang WT, Lin YP (2004) Bayesian sampling plans for exponential distribution based on uniform random censored data. Comput Stat Data Anal 44:669–691

    Article  MathSciNet  Google Scholar 

  • Huang SR, Wu SJ (2008) Reliability sampling plans under progressive type I interval censoring using cost functions. IEEE Trans Reliab 57:445–451

    Article  Google Scholar 

  • Ismail AA (2009) Optimum constant-stress partially accelerated life test plans with type II censoring: the case of Weibull failure distribution. Bull Stat Econ 3:39–46

    MathSciNet  Google Scholar 

  • Jun CH, Balamurali S, Lee SH (2006) Variables sampling plans for Weibull distributed lifetimes under sudden death testing. IEEE Trans Reliab 55:53–58

    Article  Google Scholar 

  • Lee HL, Tagaras G (1989) On the robustness of the modified beta distributions for acceptance sampling in statistical quality control. Nav Res Logist 36:447–461

    Article  MathSciNet  MATH  Google Scholar 

  • Leslie J, van Eeden C (1993) On a characterization of the exponential distribution based on a type II right censored sample. Ann Stat 21:1640–1647

    Article  MATH  Google Scholar 

  • Lu W, Tsai TR (2009) Interval censored sampling plans for the gamma lifetime model. Eur J Oper Res 192:116–124

    Article  MathSciNet  MATH  Google Scholar 

  • Pérez-González CJ, Fernández AJ (2009) Accuracy of approximate progressively censored reliability sampling plans for exponential models. Stat Pap 50:161–170

    Article  MATH  Google Scholar 

  • Savchuk VP, Martz HF (1994) Bayes reliability estimation using multiple sources of prior information: binomial sampling. IEEE Trans Reliab 43:138–144

    Article  Google Scholar 

  • Schneider H (1989) Failure-censored variables-sampling plans for lognormal and Weibull distributions. Technometrics 31:199–206

    Article  Google Scholar 

  • Srinivasa-Rao G (2009) A group acceptance sampling plans for lifetimes following a generalized exponential distribution. Econ Qual Control 24:75–85

    MathSciNet  Google Scholar 

  • Starbird SA (1994) The effect of acceptance sampling and risk aversion on the quality delivered by suppliers. J Oper Res Soc 45:309–320

    MATH  Google Scholar 

  • Tagaras G, Lee HL (1987) Optimal Bayesian single-sampling attribute plans with modified beta prior distribution. Nav Res Logist 34:789–801

    Article  MathSciNet  MATH  Google Scholar 

  • Wu JW, Tsai WL (2000) Failure-censored sampling plan for the Weibull distribution. Int J Inf Manag Sci 11:13–25

    MathSciNet  MATH  Google Scholar 

  • Wu JW, Tsai TR, Ouyang LY (2001) Limited failure-censored life test for the Weibull distribution. IEEE Trans Reliab 50:107–111

    Article  Google Scholar 

  • Xiong C, Yan Y, Ji M (2003) Sample sizes for comparing means of two lifetime distributions with type II censored data: application in an aging intervention study. Controlled Clin Trials 24:283–293

    Article  Google Scholar 

  • Xu JL, Yang G (1995) A note on a characterization of the exponential distribution based on a type II censored sample. Ann Stat 23:769–773

    Article  MATH  Google Scholar 

Download references

Acknowledgments

The authors thank the editor and the anonymous reviewer for their valuable comments. This research was partially supported by the grant SolSubC200801000048 from the Canary Islands Government and the grant MTM2010-16828 from Spanish Ministerio de Ciencia e Innovación (MICINN).

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Carlos J. Pérez-González.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Pérez-González, C.J., Fernández, A.J. Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis. Comput Stat 28, 1333–1350 (2013). https://doi.org/10.1007/s00180-012-0360-y

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00180-012-0360-y

Keywords

Navigation