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An Overlapping Local Community Detection Algorithm Based on Node Transitivity and Modularity Density

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Computer Supported Cooperative Work and Social Computing (ChineseCSCW 2020)

Abstract

The local community detection (LCD) method can discover the local community structure in which the seed node is located. Compared with global community detection, local community detection is characterized by its low cost and high efficiency. However, most existing LCD methods only return a non-overlapping community. Individuals in the real world may participate in multiple communities, which can only be discovered by using overlapping local community detection methods. In this study, an overlapping local community detection algorithm based on modularity and node transitivity. First, the scope and structure information of the overlapping communities are obtained according to the node transitivity. Second, NMF is used to obtain the number of overlapping communities. Finally, the local modularity density based on edge weights is used to refine the detected local communities. The experimental results validate the high performance of our method to the other method in comparison.

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Acknowledgements

This work is partly supported by the National Natural Science Foundation of China under Grant No. 61672159, No. 61672158, No. 62002063 and No. 61300104, the Fujian Collaborative Innovation Center for Big Data Applications in Governments, the Fujian Industry-Academy Cooperation Project under Grant No. 2017H6008 and No. 2018H6010, the Natural Science Foundation of Fujian Province under Grant No. 2019J01835 and No.2020J01230054, and Haixi Government Big Data Application Cooperative Innovation Center.

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Correspondence to Kun Guo .

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Huang, X., Wu, L., Guo, K. (2021). An Overlapping Local Community Detection Algorithm Based on Node Transitivity and Modularity Density. In: Sun, Y., Liu, D., Liao, H., Fan, H., Gao, L. (eds) Computer Supported Cooperative Work and Social Computing. ChineseCSCW 2020. Communications in Computer and Information Science, vol 1330. Springer, Singapore. https://doi.org/10.1007/978-981-16-2540-4_35

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  • DOI: https://doi.org/10.1007/978-981-16-2540-4_35

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  • Online ISBN: 978-981-16-2540-4

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