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A Model of Saliency-Based Selective Attention for Machine Vision Inspection Application

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Adaptive and Natural Computing Algorithms (ICANNGA 2011)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 6594))

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Abstract

A machine vision inspection model of surface defects, inspired by the methodologies of neuroanatomy and psychology, is investigated. Firstly, the features extracted from defect images are combined into a saliency map. The bottom-up attention mechanism then obtains ‘‘what’’ and ‘‘where’’ information. Finally, the Markov model is used to classify the types of the defects. Experimental results demonstrate the feasibility and effectiveness of the proposed model with 94.40% probability of accurately detecting of the existence of cropper strips defects.

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References

  1. Zheng, H., Kong, L., Nahavandi, S.: Automatic Inspection of Metallic Surface Defects using Genetic Algorithms. Journal of Materials Processing Tech. 125, 427–433 (2002)

    Article  Google Scholar 

  2. Liang, R., Ding, Y., Zhang, X., Chen, J.: Copper Strip Surface Defects Inspection Based on SVM-RBF. In: 4th International Conference on Natural Computation, pp. 41–45. IEEE Press, New York (2008)

    Google Scholar 

  3. Zhong, K.-H., Ding, M.-Y., Zhou, C.-P.: Texture Defect Inspection Method using Difference Statistics Feature in Wavelet Domain. Systems Engineering and Electronics 26, 660–665 (2004)

    Google Scholar 

  4. Zhang, X., Liang, R., Ding, Y., Chen, J., Duan, D., Zong, G.: The System of Copper Strips Surface Defects Inspection Based on Intelligent Fusion. In: 2008 IEEE International Conference on Automation and Logistics, pp. 476–480. IEEE Press, New York (2008)

    Chapter  Google Scholar 

  5. Li, T.-S.: Applying Wavelets Transform, Rough Set Theory and Support Vector Machine for Copper Clad Laminate Defects Classification. Expert Systems with Applications 36, 5822–5829 (2009)

    Article  Google Scholar 

  6. Luo, S.-W.: Information Processing Theory of Visual Perception. publishing house of electronics industry, Beijing (2006)

    Google Scholar 

  7. Noton, D., Stark, L.: Eye Movements and Visual Perception. Scientific American 224, 35–43 (1971)

    Google Scholar 

  8. Didday, R., Arbib, M.: Eye Movements and Visual Perception: A Two Visual System Model. International Journal of Man-Machine Studies 7, 547–570 (1975)

    Article  MATH  Google Scholar 

  9. Itti, L., Koch, C., Niebur, E.: A Model of Saliency-based Visual Attention for Rapid Scene Analysis. IEEE Transactions on Pattern Analysis and Machine Intelligence 20, 1254–1259 (1998)

    Article  Google Scholar 

  10. Rimey, R., Brown, C.: Selective Attention as Sequential Behavior: Modeling Eye Movements with An Augmented Hidden Markov Model. Department of Computer Science, University of Rochester (1990)

    Google Scholar 

  11. Salah, A., Alpaydin, E., Akarun, L.: A Selective Attention-based Method for Visual Pattern Recognition with Application to Handwritten Digit Recognition and Face Recognition. IEEE Transactions on Pattern Analysis and Machine Intelligence 24, 420–425 (2002)

    Article  Google Scholar 

  12. Corbetta, M.: Frontoparietal Cortical Networks for Directing Attention and The Eye to Visual locations: Identical, independent, or overlapping neural systems? Proc. Natl. Acad. Sci. USA 95, 831–838 (1998)

    Article  Google Scholar 

  13. Vazquez, E., Gevers, T., Lucassen, M., Weijer, J., Baldrich, R.: Saliency of Color Image Derivatives: A Comparison between Computational Models and Human Perception. J. Opt. Soc. Am. A 27, 613–621 (2010)

    Article  Google Scholar 

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© 2011 Springer-Verlag Berlin Heidelberg

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Ding, XF., Xu, LZ., Zhang, XW., Gong, F., Shi, AY., Wang, HB. (2011). A Model of Saliency-Based Selective Attention for Machine Vision Inspection Application. In: Dobnikar, A., Lotrič, U., Šter, B. (eds) Adaptive and Natural Computing Algorithms. ICANNGA 2011. Lecture Notes in Computer Science, vol 6594. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20267-4_13

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  • DOI: https://doi.org/10.1007/978-3-642-20267-4_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-20266-7

  • Online ISBN: 978-3-642-20267-4

  • eBook Packages: Computer ScienceComputer Science (R0)

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