Abstract
A machine vision inspection model of surface defects, inspired by the methodologies of neuroanatomy and psychology, is investigated. Firstly, the features extracted from defect images are combined into a saliency map. The bottom-up attention mechanism then obtains ‘‘what’’ and ‘‘where’’ information. Finally, the Markov model is used to classify the types of the defects. Experimental results demonstrate the feasibility and effectiveness of the proposed model with 94.40% probability of accurately detecting of the existence of cropper strips defects.
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Ding, XF., Xu, LZ., Zhang, XW., Gong, F., Shi, AY., Wang, HB. (2011). A Model of Saliency-Based Selective Attention for Machine Vision Inspection Application. In: Dobnikar, A., Lotrič, U., Šter, B. (eds) Adaptive and Natural Computing Algorithms. ICANNGA 2011. Lecture Notes in Computer Science, vol 6594. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-20267-4_13
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DOI: https://doi.org/10.1007/978-3-642-20267-4_13
Publisher Name: Springer, Berlin, Heidelberg
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