Abstract
The main goals of this article are to report an implementation and a quantitative study of Exponent Monte Carlo, an enhanced version of Monte Carlo for verifying high circuit yield in the presence of random process variations. Results on industry-grade standard cell netlists and compact models in 45nm show that EMC predicts reasonable results at least 1,000 times faster than MC.
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Zuber, P., Matvejev, V., Roussel, P., Dobrovolný, P., Miranda, M. (2010). Exponent Monte Carlo for Quick Statistical Circuit Simulation. In: Monteiro, J., van Leuken, R. (eds) Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation. PATMOS 2009. Lecture Notes in Computer Science, vol 5953. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-11802-9_8
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DOI: https://doi.org/10.1007/978-3-642-11802-9_8
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