High-resolution, high-throughput imaging with a multibeam scanning electron microscope
- PMID: 25627873
- PMCID: PMC4670696
- DOI: 10.1111/jmi.12224
High-resolution, high-throughput imaging with a multibeam scanning electron microscope
Abstract
Electron-electron interactions and detector bandwidth limit the maximal imaging speed of single-beam scanning electron microscopes. We use multiple electron beams in a single column and detect secondary electrons in parallel to increase the imaging speed by close to two orders of magnitude and demonstrate imaging for a variety of samples ranging from biological brain tissue to semiconductor wafers.
Keywords: High-throughput imaging; multibeam; parallel data acquisition; scanning electron microscopy.
© 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.
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