「荷電粒子」に関連した英語例文の一覧と使い方(2ページ目) - Weblio英語例文検索

荷電粒子の加速方法及び荷電粒子周回装置例文帳に追加

CHARGED PARTICLE ACCELERATION METHOD AND CHARGED PARTICLE ORBITING EQUIPMENT - 特許庁

荷電粒子加速装置及び荷電粒子加速方法例文帳に追加

CHARGED PARTICLE ACCELERATOR AND CHARGED PARTICLE ACCELERATING METHOD - 特許庁

荷電粒子線の調整方法、及び荷電粒子線装置例文帳に追加

ADJUSTMENT METHOD OF CHARGED PARTICLE BEAM AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線装置用絞り、及び荷電粒子線装置例文帳に追加

DIAPHRAGM FOR CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線調整方法及び荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM ADJUSTMENT METHOD, AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線走査方法及び荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM SCAN METHOD, AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線露光方法及び荷電粒子線露光装置例文帳に追加

EXPOSURE METHOD AND EXPOSURE DEVICE OF CHARGED-PARTICLE BEAM - 特許庁

荷電粒子線露光装置及び荷電粒子線露光方法例文帳に追加

DEVICE AND METHOD FOR CHARGED PARTICLE BEAM EXPOSURE - 特許庁

荷電粒子線露光方法及び荷電粒子線露光装置例文帳に追加

METHOD AND DEVICE FOR CHARGED PARTICLE BEAM EXPOSURE - 特許庁

荷電粒子線偏向装置および荷電粒子線照射装置例文帳に追加

CHARGED PARTICLE BEAM DEFLECTOR AND IRRADIATOR - 特許庁

荷電粒子線調整方法、及び荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM ADJUSTMENT METHOD AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線調整方法、及び荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM ADJUSTMENT METHOD, AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線装置及び荷電粒子線露光装置例文帳に追加

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM EXPOSURE DEVICE - 特許庁

荷電粒子線顕微方法および荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM MICROSCOPIC METHOD, AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線調整方法及び荷電粒子線装置例文帳に追加

ADJUSTING METHOD OF CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM SYSTEM - 特許庁

荷電粒子線装置と荷電粒子線顕微方法例文帳に追加

ELECTRIC CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM MICROSCOPY - 特許庁

荷電粒子線装置、及び荷電粒子線評価装置例文帳に追加

CHARGED PARTICLE BEAM DEVICE, AND CHARGED PARTICLE BEAM EVALUATION DEVICE - 特許庁

荷電粒子線装置及び荷電粒子線照射方法例文帳に追加

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR CHARGED PARTICLE BEAM IRRADIATION - 特許庁

荷電粒子線レンズアレイ、該荷電粒子線レンズアレイを用いた荷電粒子線露光装置例文帳に追加

CHARGED PARTICLE BEAM LENS ARRAY, CHARGED PARTICLE BEAM EXPOSURE DEVICE EMPLOYING THE CHARGED PARTICLE BEAM LENS ARRAY - 特許庁

荷電粒子線偏向装置、荷電粒子線の偏向方法および荷電粒子線装置例文帳に追加

CHARGED PARTICLE BEAM DEFLECTION DEVICE, CHARGED PARTICLE BEAM DEFLECTION METHOD AND CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子線レンズアレイ、及び該荷電粒子線レンズアレイを用いた荷電粒子線露光装置例文帳に追加

ELECTRICALLY CHARGED PARTICLE BEAM LENS ARRAY AND ELECTRICALLY CHARGED PARTICLE BEAM EXPOSURE DEVICE USING THE SAME - 特許庁

荷電粒子ビーム用偏向器、荷電粒子ビーム用アセンブリおよび荷電粒子ビーム装置例文帳に追加

DEFLECTOR FOR CHARGED PARTICLE BEAM, ASSEMBLY FOR CHARGED PARTICLE BEAM, AND CHARGED PARTICLE BEAM APPARATUS - 特許庁

荷電粒子線照射装置、荷電粒子線照射方法及び荷電粒子線照射プログラム例文帳に追加

DEVICE, METHOD AND PROGRAM OF CHARGED-PARTICLE BEAM IRRADIATION - 特許庁

荷電粒子ビームの荷電粒子を偏向及びエネルギー選択する荷電粒子ユニットに関する。例文帳に追加

This is a charged particle unit which deflects and energy selects charged particles of a charged particle beam. - 特許庁

荷電粒子ビーム結像方法、荷電粒子ビーム結像装置及び荷電粒子ビーム露光装置例文帳に追加

METHOD AND DEVICE FOR IMAGING CHARGED PARTICLE BEAM, AND EXPOSURE DEVICE THEREFOR - 特許庁

荷電粒子線成形マスク、荷電粒子線露光装置および荷電粒子検査方法例文帳に追加

CHARGED PARTICLE BEAM FORMING MASK, CHARGED PARTICLE BEAM EXPOSURE DEVICE, AND METHOD OF INSPECTING CHARGED PARTICLE BEAM - 特許庁

荷電粒子を囲む力の場例文帳に追加

a field of force surrounding a charged particle  - 日本語WordNet

荷電粒子偏向電磁石例文帳に追加

CHARGED PARTICLE DEFLECTION ELECTROMAGNET - 特許庁

荷電粒子線顕微鏡装置、荷電粒子線応用装置、荷電粒子線顕微方法、荷電粒子線検査方法、及び電子顕微鏡装置例文帳に追加

CHARGED PARTICLE BEAM MICROSCOPE DEVICE, CHARGED PARTICLE BEAM APPLICATION DEVICE, CHARGED PARTICLE BEAM MICROSCOPIC METHOD, CHARGED PARTICLE BEAM INSPECTION METHOD AND ELECTRON MICROSCOPE - 特許庁

現像剤は更に荷電粒子を含む。例文帳に追加

The developer further includes charged particles. - 特許庁

走査型荷電粒子ビーム顕微鏡例文帳に追加

SCANNING TYPE CHARGED PARTICLE BEAM MICROSCOPE - 特許庁

走査荷電粒子顕微鏡例文帳に追加

SCANNING CHARGED PARTICLE MICROSCOPE - 特許庁

集束荷電粒子ビーム装置例文帳に追加

FOCUSING CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子ビーム照射システム例文帳に追加

CHARGED PARTICLE BEAM IRRADIATION SYSTEM - 特許庁

医療用荷電粒子照射装置例文帳に追加

MEDICAL CHARGED PARTICLE IRRADIATION APPARATUS - 特許庁

荷電粒子ビーム照射装置例文帳に追加

CHARGED PARTICLE BEAM IRRADIATION APPARATUS - 特許庁

荷電粒子ビーム処理装置例文帳に追加

CHARGED PARTICLE BEAM PROCESSOR - 特許庁

走査型荷電粒子ビ—ム装置例文帳に追加

SCANNING CHARGED PARTICLE BEAM DEVICE - 特許庁

荷電粒子ビーム描画方法例文帳に追加

CHARGED PARTICLE BEAM DRAWING METHOD - 特許庁

荷電粒子線観察装置例文帳に追加

CHARGED PARTICLE BEAM OBSERVATION DEVICE - 特許庁

荷電粒子ビ—ム露光装置例文帳に追加

CHARGED PARTICLE BEAM EXPOSURE DEVICE - 特許庁

荷電粒子ビーム計測装置例文帳に追加

CHARGED PARTICLE BEAM MEASURING DEVICE - 特許庁

荷電粒子線露光装置例文帳に追加

CHARGED PARTICLE BEAM EXPOSING DEVICE - 特許庁

荷電粒子線加工装置例文帳に追加

CHARGED PARTICLE BEAM PROCESSING APPARATUS - 特許庁

荷電粒子線試験装置例文帳に追加

CHARGED PARTICLE RAY TEST DEVICE - 特許庁