光線検査の英語

この光線透過部１５を利用して欠陥検査装置３が配設されていることにより、搬送対象物が透明材料であっても、非接触状態での搬送中に欠陥検査が行える搬送検査装置が提供される。例文帳に追加

Since the defect inspection device 3 is disposed by utilizing the beam transmission part 15, the conveyance inspection device capable of performing defect inspection during conveyance in the noncontact state even when the conveyance object is a transparent material is provided. - 特許庁

容器の同一部位を透過した光線は分配光学系手段であるハーフミラー５，６により各撮像系カメラ２，３，４に分配され、外観検査、歪検査などの複数種類の検査を同時に行う。例文帳に追加

The light beam transmitted through the same portion of the container is distributed by half mirrors 5 and 6 as distributive optical means among the imaging cameras 2 to 4, which simultaneously perform a plurality of types of inspections including a visual inspection and a strain inspection. - 特許庁

検査対象曲面鏡の設計データを基に、撮像位置で撮像される検査用パターンの反射像がゆがみのない直線状または真円状のパターンとなるように、検査用パターン配置位置での該検査用パターンを光線追跡演算で求めて作成する。例文帳に追加

The pattern for the inspection in an arrangement position of the pattern for the inspection is found by a ray tracing computation to be prepared, so as to bring a reflection image of the pattern for the inspection imaged in the imaging position into a linear or a truly round pattern having no distortion, based on a design data for the inspection-objective curved surface mirror. - 特許庁

被検査面Ｆを略中心として放射状に、且つ、併せて検査面を包囲する円弧を成すように、複数が略平行に配列されている略直線状の光線照射部２１ａ・２１ａ・・・を備えた像対象物２１から、被検査面Ｆに光線束を照射することによって、該被検査面Ｆに明部と暗部とを形成する。例文帳に追加

A light beam is radiated to the inspected surface F from the image object 21 having a plurality of substantially linear light beam radiation sections 21a, 21a, etc arranged in substantially parallel so as to form a circular arc surrounding an inspection surface radially about the inspected surface F as a substantially center, thereby forming a bright section and dark section on the inspected surface F. - 特許庁

照明手段８はそれぞれの撮像系カメラ２，３，４に必要な検査波長を包含する光線を出す。例文帳に追加

The illuminating means 8 emit a light beam containing inspection wavelengths necessary to the imaging cameras 2 to 4. - 特許庁

工具スピンドル（２２）が回転され、光線（３３）を用いて工具（４０）がふらつき運動をしているか否か検査される。例文帳に追加

While the tool spindle (22) is rotated, it is inspected by a light (33) whether or not the tool (40) performs a wobbling motion. - 特許庁

受光部18で受光した検査光線21の光量を、例えば、受光素子で電流に変換して反射光量を計測する。例文帳に追加

A light quantity of the inspecting light beams 21 received by the light receiving part 18 is measured, for example, as a reflected light quantity by being converted into current with a receiving element. - 特許庁

計測した検査光線21の反射光量が所定値よりも少なければ「研磨が不十分である」とし、多ければ「研磨が良好である」とする。例文帳に追加

'Polishing is not satisfactory' is judged when the reflected light quantity of measured inspecting light beams 21 is smaller than a prescribed value, while 'polishing is excellent' is judged when it is larger than the value. - 特許庁