Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator
IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Analog Circuits and Related SoC Integration Technologies
Chip Level Simulation of Substrate Noise Coupling and Interference in RF ICs with CMOS Digital Noise Emulator
Naoya AZUMA, Shunsuke SHIMAZAKI, Noriyuki MIURA, Makoto NAGATA, Tomomitsu KITAMURA, Satoru TAKAHASHI, Motoki MURAKAMI, Kazuaki HORI, Atsushi NAKAMURA, Kenta TSUKAMOTO, Mizuki IWANAMI, Eiji HANKUI, Sho MUROGA, Yasushi ENDO, Satoshi TANAKA, Masahiro YAMAGUCHI
Author information
Keywords: substrate coupling, power delivery network, noise interference, wireless communication
JOURNAL RESTRICTED ACCESS

2014 Volume E97.C Issue 6 Pages 546-556

Details
Download PDF (5502K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Abstract
Substrate noise coupling in RF receiver front-end circuitry for LTE wireless communication was examined by full-chip level simulation and on-chip measurements, with a demonstrator built in a 65nm CMOS technology. A CMOS digital noise emulator injects high-order harmonic noises in a silicon substrate and induces in-band spurious tones in an RF receiver on the same chip through substrate noise interference. A complete simulation flow of full-chip level substrate noise coupling uses a decoupled modeling approach, where substrate noise waveforms drawn with a unified package-chip model of noise source circuits are given to mixed-level simulation of RF chains as noise sensitive circuits. The distribution of substrate noise in a chip and the attenuation with distance are simulated and compared with the measurements. The interference of substrate noise at the 17th harmonics of 124.8MHz — the operating frequency of the CMOS noise emulator creates spurious tones in the communication bandwidth at 2.1GHz.
Content from these authors
© 2014 The Institute of Electronics, Information and Communication Engineers
Previous article Next article
Favorites & Alerts

Recently viewed articles
Announcements from publisher
Share this page
feedback
 Top