Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa
Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations
Takaaki OKUMURA, Atsushi KUROKAWA, Hiroo MASUDA, Toshiki KANAMOTO, Masanori HASHIMOTO, Hiroshi TAKAFUJI, Hidenari NAKASHIMA, Nobuto ONO, Tsuyoshi SAKATA, Takashi SATO
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Keywords: SSTA, output, transition time, gate delay model, process variation
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2009 Volume E92.A Issue 4 Pages 990-997

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Abstract

Process variation is becoming a primal concern in timing closure of LSI (Large Scale Integrated Circuit) with the progress of process technology scaling. To overcome this problem, SSTA (Statistical Static Timing Analysis) has been intensively studied since it is expected to be one of the most efficient ways for performance estimation. In this paper, we study variation of output transition-time. We firstly clarify that the transition-time variation can not be expressed accurately by a conventional first-order sensitivity-based approach in the case that the input transition-time is slow and the output load is small. We secondly reveal quadratic dependence of the output transition-time to operating margin in voltage. We finally propose a procedure through which the estimation of output transition-time becomes continuously accurate in wide range of input transition-time and output load combinations.

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© 2009 The Institute of Electronics, Information and Communication Engineers
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