Device Characterization of Thin-Film Phototransistors for Photosensor Applications
IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Electronic Displays
Device Characterization of Thin-Film Phototransistors for Photosensor Applications
Mutsumi KIMURAYoshitaka NISHIZAKITakehiko YAMASHITATakehiro SHIMATomohisa HACHIDA
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2008 Volume E91.C Issue 10 Pages 1557-1563

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Abstract

Two types of thin-film phototransistors (TFPTs), p/i/n TFPT and n/i/n TFPT, are characterized from the viewpoint of operation condition and device behavior. It is found that the detected current can be both independent of the applied voltage (Vapply) and linearly dependent on the photo-illuminance in the saturation region of the p/i/n TFPT. This characteristic is because even if Vapply increases, the depletion layer remains in the whole intrinsic region, and the electric field changes only near the p-type/intrinsic interface and intrinsic/n-type interface but remains in the most intrinsic region. This characteristic is preferable for some kinds of photosensor applications. Finally, an application example of the p/i/n TFPT, artificial retina, is introduced.

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© 2008 The Institute of Electronics, Information and Communication Engineers
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