Abstract
In this paper, the integration of design and test flows for mixed-signal circuits is discussed. The aim is to decrease test generation and debugging costs and time-to-market for the analogue blocks in mixed-signal circuits. A tool developed in order to automate the data sharing between design and test environments is described and the functionality of this tool is explained. The generation of a test plan consists of the selection of the separate test functions and addition of commands for control signal generation and tester routing. The usage of design data for each of these functions is explained and the tool is evaluated in the design and testing of a mixed-signal demonstrator circuit. Results from this experience are discussed.
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Engin, N., Kerkhoff, H.G., Tangelder, R.J. et al. Integrated Design and Test of Mixed-Signal Circuits. Journal of Electronic Testing 14, 75–83 (1999). https://doi.org/10.1023/A:1008301406467
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DOI: https://doi.org/10.1023/A:1008301406467