Abstract
In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior and circuit simulations are performed to validate the proposed technique and analyze the design tradeoffs, and preliminary measurement results on FPGA are also presented.
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Editor: M. Soma
*This work was partially supported by the National Science Council of Taiwan, R.O.C., under Grant No. NSC92-2220-E-002-017.
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Huang, JL., Huang, JJ. & Liu, YS. A Low-Cost Jitter Measurement Technique for BIST Applications. J Electron Test 22, 219–228 (2006). https://doi.org/10.1007/s10836-006-8600-0
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DOI: https://doi.org/10.1007/s10836-006-8600-0