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Modulo p = 3 Checking for a Carry Select Adder

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Abstract

In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks.

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Authors and Affiliations

  1. Department of Computer Science, Fault Tolerant Computing Group, University of Potsdam, 14439, Potsdam, Germany

    V. Ocheretnij, M. Gössel, E. S. Sogomonyan & D. Marienfeld

Authors
  1. V. Ocheretnij
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  2. M. Gössel
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  3. E. S. Sogomonyan
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  4. D. Marienfeld
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Corresponding author

Correspondence to V. Ocheretnij.

Additional information

A preliminary version of this paper was presented at the IOLTS, 2003.

This paper was supported by a research grant from Intel Corp.

Guest professor at the University of Potsdam.

Vitalij Ocheretnij studied automation and telemechanics for railways at the Saint-Petersburg Transportation State University in Russia during 1991–1996 and received the Diploma in 1996. Since 1997 he has been a member of the Fault-Tolerant Computing Group at the University of Potsdam, Germany, where he received his PhD degree in 2003. His current research projects include: fault tolerance in circuits; concurrent error detection in data path and encryption circuits; fault diagnosis. He has published over 17 papers in refereed conferences.

Michael Gössel is a full professor of computer science and the head of the Fault-Tolerant Computing Group at the University of Potsdam in Germany. He is the author and coauthor of numerous papers in the area of non-linear systems, parallel memories and fault tolerant systems design, including the books “Memory-Architecture and Parallel Access” (together with B. Rebel and R. Creutzburg), Noth Holland 1994, “Error Detection Circuits” (together with S. Graph), McGraw-Hill, 1993 and “Self-Dual Discrete Systems” (in Russian, with V. Saposhnikov and Vl. Saposhnikov), Energoatomisdat, St. Petersburg, 2001. Currently his main interests are on-line error detection, BIST and diagnosis of VLSI circuits. He currently serves on the Editorial Board of the Journal of Electronic Testing: Theory and Applications.

Egor S. Sogomonyan is a professor of the Russian Academy of Sciences, Moscow. He received his Dr. tech.sc. degree in computer sciences in 1975 from the Russian Academy of Sciences. Since 1964 he is with the Institute of Control Sciences in Moscow and his area of interest is diagnosis of fault-tolerant computing systems. He is the author of a number of books on Fault Diagnosis. Currently his research interests are design of self-checking systems. Since 1992 he is a visiting professor of the Fault-Tolerant Computing Group at the University of Potsdam, Germany.

Daniel Marienfeld studied computer science at the University of Potsdam, Germany, during 1999–2003 and received the Diploma degree in 2003. In 2003 he did a internship at the Fraunhofer institute for Computer Architecture and Software Technology FIRST. Since 2003 he has been a member of the Fault-Tolerant Computing Group at the University of Potsdam. Currently he is Phd student at the same university. His reserach interest are focused on on-line error detection for arithmetic units. He is a student member of the IEEE and has published over 8 papers in refereed conference proceedings.

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Ocheretnij, V., Gössel, M., Sogomonyan, E.S. et al. Modulo p = 3 Checking for a Carry Select Adder. J Electron Test 22, 101–107 (2006). https://doi.org/10.1007/s10836-006-6260-8

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  • DOI: https://doi.org/10.1007/s10836-006-6260-8

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