Home Journal of Electronic Testing Article Guest Editorial Published: June 2005 Volume 21, page 203, (2005) Cite this article Journal of Electronic Testing Aims and scope Submit manuscript Adoración Rueda, Michel Renovell & José Luis Huertas 30 Accesses Explore all metrics This is a preview of subscription content, log in via an institution to check access. Access this article Log in via an institution Subscribe and save Springer+ Basic ¥17,985 /Month Get 10 units per month Download Article/Chapter or eBook 1 Unit = 1 Article or 1 Chapter Cancel anytime Subscribe now Buy Now Buy article PDF ¥ 4,980 Price includes VAT (Japan) Instant access to the full article PDF. Institutional subscriptions AuthorsAdoración RuedaView author publicationsYou can also search for this author inPubMed Google ScholarMichel RenovellView author publicationsYou can also search for this author inPubMed Google ScholarJosé Luis HuertasView author publicationsYou can also search for this author inPubMed Google ScholarRights and permissionsReprints and permissionsAbout this articleCite this articleRueda, A., Renovell, M. & Huertas, J.L. Guest Editorial. J Electron Test 21, 203 (2005). https://doi.org/10.1007/s10836-005-6350-zDownload citationIssue Date: June 2005DOI: https://doi.org/10.1007/s10836-005-6350-zShare this articleAnyone you share the following link with will be able to read this content:Get shareable linkSorry, a shareable link is not currently available for this article.Copy to clipboard Provided by the Springer Nature SharedIt content-sharing initiative