Abstract
Switched current (SI) circuits use analogue memory cells as building blocks. In these cells, like in most analogue circuits, there are hard-to-detect faults with conventional test methods. A test approach based on a built-in dynamic current sensor (BIDCS), whose detection method weights the highest frequency components of the dynamic supply current of the circuit under test, makes possible the detection of these faults, taking into account the changes in the slope of the dynamic supply current induced by the fault. A study of the influence of these faults in neighbouring cells helps to minimize the number of BICS needed in SI circuits as is shown in two algorithmic analogue-to-digital converters.
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Yolanda Lechuga received a degree in Industrial Engineering from the University of Cantabria (Spain) in April 2000. Since then, she has been collaborating with the Microelectronics Engineering Group at the University of Cantabria, in the Electronics Technology, Systems and Automation Engineering Department. Since October 2000 she has been a post-graduate student, to be appointed as lecturer at this university, where she is working in her Ph.D. She is interested in supply current test methods, fault simulation, BIST and design for test of mixed signal integrated circuits.
Román Mozuelos received a degree in Physics with electronics from the University of Cantabria, Spain. From 1991 to 1995 he was working on the development of quartz crystal oscillators. Currently, he is a Ph.D. student and an assistant teacher at the University of Cantabria in the Department of Electronics Technology. His interests include mixed-signal design and test, fault simulation, and supply current monitoring.
Miguel A. Allende received his graduate degree in 1985 and Ph.D. degree in 1994, both from the University of Cantabria, Santander, Spain. In 1996, he became an Assistant Professor of Electronics Technology at the same Institution, where he is a member of the Microelectronics Engineering Group at the Electronics Technology, Systems and Automation Engineering Department in the Industrial and Telecommunication Engineering School. His research interests include design of VLSI circuits for industrial applications, test and DfT in digital VLSI communication circuits, and power supply current test of mixed, analogue and digital circuits.
Mar Martínez received her graduate degree and Ph.D. from the University of Cantabria (Spain) in 1986 and 1990. She has been Assistant Professor of Electronic Technology at the University of Cantabria (Spain) since 1991. At present, she is a member of the Electronics Technology, Systems and Automation Engineering Department in the Industrial and Telecommunication Engineering School. She has participated in several EU and Spanish National Research Projects. Her main research interest is mixed, analogue and digital circuit testing, using techniques based on supply current monitoring. She is also interested in test and design for test in digital VLSI circuits.
Salvador Bracho obtained his graduate degree and Ph.D. from the University of Seville (Spain) in 1967 and 1970. He was appointed Professor of Electronic Technology at the University of Cantabria (Spain) in 1973, where, at present, he is a member of the Electronics Technology, Systems and Automation Engineering Department in the Industrial and Telecommunication Engineering School. He has participated, as leader of the Microelectronics Engineering Group at the University of Cantabria, in more than twenty EU and Spanish National Research Projects. His primary research interest is in the area of test and design for test, such as full scan, partial scan or self-test techniques in digital VLSI communication circuits. He is also interested in mixed-signal, analogue and digital test, using methods based on power supply current monitoring. Another research interest is the design of analogue and digital VLSI circuits for industrial applications. Prof. Bracho is a member of the Institute of Electrical and Electronic Engineers.
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Lechuga, Y., Mozuelos, R., Allende, M.A. et al. Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors. J Electron Test 21, 583–598 (2005). https://doi.org/10.1007/s10836-005-2543-8
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DOI: https://doi.org/10.1007/s10836-005-2543-8