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A comparative evaluation of neural networks and hidden Markov models for monitoring turning tool wear

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Abstract

Condition monitoring of machine tool inserts is important for increasing the reliability and quality of machining operations. Various methods have been proposed for effective tool condition monitoring (TCM), and currently it is generally accepted that the indirect sensor-based approach is the best practical solution to reliable TCM. Furthermore, in recent years, neural networks (NNs) have been shown to model successfully, the complex relationships between input feature sets of sensor signals and tool wear data. NNs have several properties that make them ideal for effectively handling noisy and even incomplete data sets. There are several NN paradigms which can be combined to model static and dynamic systems. Another powerful method of modeling noisy dynamic systems is by using hidden Markov models (HMMs), which are commonly employed in modern speech-recognition systems. The use of HMMs for TCM was recently proposed in the literature. Though the results of these studies were quite promising, no comparative results of competing methods such as NNs are currently available. This paper is aimed at presenting a comparative evaluation of the performance of NNs and HMMs for a TCM application. The methods are employed on exactly the same data sets obtained from an industrial turning operation. The advantages and disadvantages of both methods are described, which will assist the condition-monitoring community to choose a modeling method for other applications.

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Authors and Affiliations

  1. Design and Mechatronics Division Department of Mechanical Engineering, University of Stellenbosch, Stellenbosch, 7602, South Africa

    C. Scheffer

  2. DSP Research Group Department of Electronic Engineering, University of Stellenbosch, Stellenbosch, 7602, South Africa

    H. Engelbrecht

  3. Dynamic Systems Group Department of Mechanical and Aeronautical Engineering, University of Pretoria, Pretoria, 0002, South Africa

    P. S. Heyns

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  1. C. Scheffer
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  2. H. Engelbrecht
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  3. P. S. Heyns
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Correspondence to C. Scheffer.

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Scheffer, C., Engelbrecht, H. & Heyns, P.S. A comparative evaluation of neural networks and hidden Markov models for monitoring turning tool wear. Neural Comput & Applic 14, 325–336 (2005). https://doi.org/10.1007/s00521-005-0469-9

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  • DOI: https://doi.org/10.1007/s00521-005-0469-9

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