Home Journal of Electronic Testing Article Past TTTC Events Published: 04 May 2017 Volume 33, pages 277–279, (2017) Cite this article Journal of Electronic Testing Aims and scope Submit manuscript We’re sorry, something doesn't seem to be working properly. Please try refreshing the page. If that doesn't work, please contact support so we can address the problem. This is a preview of subscription content, log in via an institution to check access. Access this article Log in via an institution Subscribe and save Springer+ Basic ¥17,985 /Month Get 10 units per month Download Article/Chapter or eBook 1 Unit = 1 Article or 1 Chapter Cancel anytime Subscribe now Buy Now Buy article PDF ¥ 4,980 Price includes VAT (Japan) Instant access to the full article PDF. Rent this article via DeepDyve Institutional subscriptions Rights and permissionsReprints and permissionsAbout this articleCite this article Past TTTC Events. J Electron Test 33, 277–279 (2017). https://doi.org/10.1007/s10836-017-5662-0Download citationPublished: 04 May 2017Issue Date: June 2017DOI: https://doi.org/10.1007/s10836-017-5662-0Share this articleAnyone you share the following link with will be able to read this content:Get shareable linkSorry, a shareable link is not currently available for this article.Copy to clipboard Provided by the Springer Nature SharedIt content-sharing initiative