Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs | SpringerLink
Skip to main content

Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs

  • Conference paper
  • First Online:
Applied Reconfigurable Computing (ARC 2017)

Part of the book series: Lecture Notes in Computer Science ((LNTCS,volume 10216))

Included in the following conference series:

Abstract

This paper investigates the use of Triple Modular Redundancy (TMR) in hardware accelerators designs described in C programming language and synthesized by High Level Synthesis (HLS). A setup composed of a soft-core processor and a matrix multiplication design protected by TMR and embedded into an SRAM-based FPGA was analyzed under accumulated bit-flips in its configuration memory bits. Different configurations using single and multiple input and output workload data streams were tested. Results show that by using a coarse grain TMR with triplicated inputs, voters, and outputs, it is possible to reach 95% of reliability by accumulating up to 61 bit-flips and 99% of reliability by accumulating up to 17 bit-flips in the configuration memory bits. These numbers imply in a Mean Time Between Failure (MTBF) of the coarse grain TMR at ground level from 50% to 70% higher than the MTBF of the unhardened version for the same reliability confidence.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
¥17,985 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
JPY 3498
Price includes VAT (Japan)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
JPY 5719
Price includes VAT (Japan)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
JPY 7149
Price includes VAT (Japan)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Carmichael, C.: Triple Module Redundancy Design Techniques for Virtex FPGAs. Xilinx, Application Note XAPP197, July 2006

    Google Scholar 

  2. Habinc, S.: Functional Triple Modular Redundancy (FTMR). Gaisler Research, Design and Assessment Report FPGA-003-01, December 2002

    Google Scholar 

  3. Xilinx: Vivado Design Suite - User Guide - High-Level Synthesis. UG902 (v2014.3), 1 October 2014

    Google Scholar 

  4. Tambara, L.A., Kastensmidt, F.L., Rech, P., Frost, C.: Decreasing FIT with diverse triple modular redundancy in SRAM-based FPGAs. In: Proceedings of IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, pp. 1–6, November 2014

    Google Scholar 

  5. Tonfat, J., Tambara, L., Santos, A., Kastensmidt, F.: Method to analyze the susceptibility of HLS designs in SRAM-based FPGAs under soft errors. In: Bonato, V., Bouganis, C., Gorgon, M. (eds.) ARC 2016. LNCS, vol. 9625, pp. 132–143. Springer, Heidelberg (2016). doi:10.1007/978-3-319-30481-6_11

    Chapter  Google Scholar 

  6. Winterstein, F., Bayliss, S., Constantinides, G.A.: High-level synthesis of dynamic data structures: a case study using Vivado HLS. In: Proceedings of International Conference on Field-Programmable Technology, pp. 362–365, December 2013

    Google Scholar 

  7. Tambara, L.A., Tonfat, J., Santos, A., Lima Kastensmidt, F., Medina, N.H., Added, N., Aguiar, V.A.P., Aguirre, F., Silveira, M.A.G.: Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors. IEEE Trans. Nucl. Sci. 1, 1–8 (2017). ISSN: 0018-9499

    Google Scholar 

  8. Chan, X., Yang, W., Zhao, M., Wang, J.: HLS-based sensitivity-induced soft error mitigation for satellite communication systems. In: 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS), pp. 143–148 (2016). ISSN 1942-9401

    Google Scholar 

  9. Xilinx: AXI4-Stream Accelerator Adapter v2.1. PG081 18 November 2015

    Google Scholar 

  10. JEDEC: Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices JEDEC Standard (2006). http://www.jedec.org/sites/default/files/docs/jesd89a.pdf

  11. Xilinx Inc.: Device Reliability Report, UG116 (v9.4) (2015)

    Google Scholar 

  12. Crowe, D., Feinberg, A.: Design for Reliability (2001). ISBN 13:978-1-4200-4084-5. https://www.crcpress.com/

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to André Flores dos Santos .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2017 Springer International Publishing AG

About this paper

Cite this paper

dos Santos, A.F., Tambara, L.A., Benevenuti, F., Tonfat, J., Kastensmidt, F.L. (2017). Applying TMR in Hardware Accelerators Generated by High-Level Synthesis Design Flow for Mitigating Multiple Bit Upsets in SRAM-Based FPGAs. In: Wong, S., Beck, A., Bertels, K., Carro, L. (eds) Applied Reconfigurable Computing. ARC 2017. Lecture Notes in Computer Science(), vol 10216. Springer, Cham. https://doi.org/10.1007/978-3-319-56258-2_18

Download citation

  • DOI: https://doi.org/10.1007/978-3-319-56258-2_18

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-56257-5

  • Online ISBN: 978-3-319-56258-2

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics