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Fusing Pretrained ViTs with TCNet for Enhanced EEG Regression

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Augmented Cognition (HCII 2024)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 14695))

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Abstract

The task of Electroencephalogram (EEG) analysis is paramount to the development of Brain-Computer Interfaces (BCIs). However, to reach the goal of developing robust, useful BCIs depends heavily on the speed and the accuracy at which BCIs can understand neural dynamics. In response to that goal, this paper details the integration of pre-trained Vision Transformers (ViTs) with Temporal Convolutional Networks (TCNet) to enhance the precision of EEG regression. The core of this approach lies in harnessing the sequential data processing strengths of ViTs along with the superior feature extraction capabilities of TCNet, to significantly improve EEG analysis accuracy. In addition, we analyze the importance of how to construct optimal patches for the attention mechanism to analyze, balancing both speed and accuracy tradeoffs. Our results showcase a substantial improvement in regression accuracy, as evidenced by the reduction of Root Mean Square Error (RMSE) from 55.4 to 51.8 on EEGEyeNet’s Absolute Position Task, outperforming existing state-of-the-art models. Without sacrificing performance, we increase the speed of this model by an order of magnitude (up to 4.32x faster). This breakthrough not only sets a new benchmark in EEG regression analysis but also opens new avenues for future research in the integration of transformer architectures with specialized feature extraction methods for diverse EEG datasets.

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Correspondence to Eric Modesitt .

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Modesitt, E., Yin, H., Huang Wang, W., Lu, B. (2024). Fusing Pretrained ViTs with TCNet for Enhanced EEG Regression. In: Schmorrow, D.D., Fidopiastis, C.M. (eds) Augmented Cognition. HCII 2024. Lecture Notes in Computer Science(), vol 14695. Springer, Cham. https://doi.org/10.1007/978-3-031-61572-6_4

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  • DOI: https://doi.org/10.1007/978-3-031-61572-6_4

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-61571-9

  • Online ISBN: 978-3-031-61572-6

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