Assessing the Condition of Copper Conductors Using Deep Learning | SpringerLink
Skip to main content

Assessing the Condition of Copper Conductors Using Deep Learning

  • Conference paper
  • First Online:
Image and Vision Computing (IVCNZ 2022)

Abstract

The timely replacement of in-service overhead electrical conductors in a distribution network is crucial for the reliable operation of the grid. Visually inspecting the conductors is a non-destructive testing method that can quickly identify sign of damage and degradation on the conductor’s surface and the result is used to inform decision in the risk management framework. In this study, a deep neural network is employed to classify a conductor’s condition into multiple classes ranked by the type and severity of the degradation. The best test accuracy of 83.02% was reached. This model can be used to improve on the current manually-intensive and time consuming inspection practice commonly used in the electrical distribution industry.

This project is funded by the R &D Fellowship Grants from New Zealand Callaghan Innovation, and is in partnership with and sponsored by Unison Networks Ltd. https://www.unison.co.nz/.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
¥17,985 /Month
  • Get 10 units per month
  • Download Article/Chapter or eBook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
JPY 3498
Price includes VAT (Japan)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
JPY 10295
Price includes VAT (Japan)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
JPY 12869
Price includes VAT (Japan)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. EPRI. Parameters that influence the aging and degradation of overhead conductors. Technical report, EPRI (2003)

    Google Scholar 

  2. Graham, M., et al.: Distribution overhead copper conductors, their condition and risk-based replacement. Electricity Engineers’ Association (2021)

    Google Scholar 

  3. Naranpanawe, L., et al.: A practical health index for overhead conductors: experience from Australian distribution networks. IEEE Access 8, 218863–218873 (2020). https://doi.org/10.1109/ACCESS.2020.3042486. ISSN 2169-3536

    Article  Google Scholar 

  4. Van der Maaten, L., Hinton, G.: Visualizing data using t-SNE. J. Mach. Learn. Res. 9(11) (2008)

    Google Scholar 

  5. Selvaraju, R.R., et al.: Grad-CAM: visual explanations from deep networks via gradient-based localization. In: Proceedings of the IEEE International Conference on Computer Vision, pp. 618–626 (2017)

    Google Scholar 

  6. Ishino, R., Tsutsumi, F.: Detection system of damaged cables using video obtained from an aerial inspection of transmission lines. In: IEEE Power Engineering Society General Meeting, vol. 2, pp. 1857–1862 (2004). https://doi.org/10.1109/PES.2004.1373201

  7. Zhang, Y., et al.: A recognition technology of transmission lines conductor break and surface damage based on aerial image. IEEE Access 7, 59022–59036 (2019). https://doi.org/10.1109/ACCESS.2019.2914766. ISSN 2169-3536

    Article  Google Scholar 

  8. Huang, X., et al.: A method of transmission conductor-loosened detect based on image sensors. IEEE Trans. Instrum. Meas. 69(11), 8783–8796 (2020). https://doi.org/10.1109/TIM.2020.2994475

    Article  Google Scholar 

  9. Song, Y., Wang, H., Zhang, J.: A vision-based broken strand detection method for a power-line maintenance robot. IEEE Trans. Power Deliv. 29(5), 2154–2161 (2014). https://doi.org/10.1109/TPWRD.2014.2328572. ISSN 1937-4208

    Article  Google Scholar 

  10. Glorot, X., Bengio, Y.: Understanding the difficulty of training deep feedforward neural networks. In: AISTATS. JMLR Proceedings, vol. 9, pp. 249–256. JMLR.org (2010)

    Google Scholar 

  11. Goodfellow, I., Bengio, Y., Courville, A.: Deep Learning. MIT Press, Cambridge (2016). https://www.deeplearningbook.org

  12. Müller, R., Kornblith, S., Hinton, G.E.: When does label smoothing help? In: Advances in Neural Information Processing Systems, vol. 32 (2019)

    Google Scholar 

  13. Krizhevsky, A., Sutskever, I., Hinton, G.E.: Imagenet classification with deep convolutional neural networks. In: Proceedings of the 25th International Conference on Neural Information Processing Systems - Volume 1, NIPS 2012, Lake Tahoe, Nevada, pp. 1097–1105. Curran Associates Inc. (2012)

    Google Scholar 

  14. Iandola, F.N., et al.: Squeezenet: Alexnet-level accuracy with 50x fewer parameters and \(< 0.5\) MB model size (2016). https://doi.org/10.48550/ARXIV.1602.07360

  15. Szegedy, C., et al.: Going deeper with convolutions. In: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 1–9 (2015). https://doi.org/10.1109/CVPR.2015.7298594

  16. He, K., et al.: Deep residual learning for image recognition. In: 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), pp. 770–778 (2016). https://doi.org/10.1109/CVPR.2016.90

  17. Sandler, M., et al.: Mobilenetv 2: inverted residuals and linear bottlenecks. In: Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 4510–4520 (2018)

    Google Scholar 

  18. Szegedy, C., et al.: Inception-v4, inception-resnet and the impact of residual connections on learning. In: Thirty-First AAAI Conference on Artificial Intelligence (2017)

    Google Scholar 

  19. Springenberg, J.T., et al.: Striving for simplicity: the all convolutional net. In: Bengio, Y., LeCun, Y. (eds.) 3rd International Conference on Learning Representations, ICLR 2015, San Diego, CA, USA, 7–9 May 2015, Workshop Track Proceedings (2015). https://arxiv.org/abs/1412.6806

Download references

Acknowledgement

The authors would like to thank Unison Networks Limited for their technical supports and regular feedback, and the entire project team for their efforts and times to collect, curate, and label the datasets.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to David Wilson .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2023 The Author(s), under exclusive license to Springer Nature Switzerland AG

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Pan, Z., Wilson, D., Stommel, M., Castellanos, A. (2023). Assessing the Condition of Copper Conductors Using Deep Learning. In: Yan, W.Q., Nguyen, M., Stommel, M. (eds) Image and Vision Computing. IVCNZ 2022. Lecture Notes in Computer Science, vol 13836. Springer, Cham. https://doi.org/10.1007/978-3-031-25825-1_13

Download citation

  • DOI: https://doi.org/10.1007/978-3-031-25825-1_13

  • Published:

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-031-25824-4

  • Online ISBN: 978-3-031-25825-1

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics