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Measuring the vulnerability of interconnection networks in embedded systems

  • Workshop on Embedded HPC Systems and Applications Devesh Bhatt, Honeywell Technology Center, USA Viktor Prasanna, Univ. of Southern California, USA
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Parallel and Distributed Processing (IPPS 1998)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1388))

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Abstract

Studies of the fault-tolerance of graphs have tended to largely concentrate on classical graph connectivity. This measure is very basic, and conveys very little information for designers to use in selecting a suitable topology for the interconnection network in embedded systems. In this paper, we study the vulnerability of interconnection networks to the failure of individual links, using a set of four measures which, taken together, provide a much fuller characterization of the network. Moreover, while traditional studies typically limit themselves to uncorrelated link failures, our model deals with both uncorrelated and correlated failure modes. This is of practical significance, since quite often, failures in networks are correlated due to physical considerations.

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References

  1. B.W.Arden and H.Lee. “Analysis of Chordal Ring Networks”, IEEE Transactions on Computers C-30, 1981.

    Google Scholar 

  2. M.Berg and I. Koren, “On Switching Policies for Modular Fault-Tolerant Computing Systems”, IEEE Transactions on Computers Vol. C-36, 1987.

    Google Scholar 

  3. F. T. Boesch, F. Harary, J. A. Kabell, “Graphs as Models of Communication Network Vulnerability: Connectivity and Persistence,” Networks, Vol. 11, 1981.

    Google Scholar 

  4. M.Choi and C.M.Krishna, “On Measures of Vulnerability of Interconnection Networks”, Microelectronics and Reliability Vol 29, No. 6, 1989.

    Google Scholar 

  5. T. Cormen, C. Leiserson and R. Rivest, Introduction to Algorithms, Cambridge: MIT Press, 1990.

    Google Scholar 

  6. C. M. Krishna and K. G. Shin, Real-Time Systems, New York: McGraw-Hill, 1997.

    Google Scholar 

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, University of Massachusetts, 01003, Amherst, MA

    V. Lakamraju, Z. Koren, I. Koren & C. M. Krishna

Authors
  1. V. Lakamraju
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  2. Z. Koren
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  3. I. Koren
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  4. C. M. Krishna
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Editor information

José Rolim

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© 1998 Springer-Verlag Berlin Heidelberg

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Lakamraju, V., Koren, Z., Koren, I., Krishna, C.M. (1998). Measuring the vulnerability of interconnection networks in embedded systems. In: Rolim, J. (eds) Parallel and Distributed Processing. IPPS 1998. Lecture Notes in Computer Science, vol 1388. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-64359-1_756

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  • DOI: https://doi.org/10.1007/3-540-64359-1_756

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-64359-3

  • Online ISBN: 978-3-540-69756-5

  • eBook Packages: Springer Book Archive

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