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Hirokazu Saitoh

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2000 – 2009

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2002
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Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka:
Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. Microelectron. Reliab. 42(9-11): 1647-1652 (2002)

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