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K. Sawada

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2010 – 2019

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2015
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M. A. Matin, A. Ikedo, Takeshi Kawano, K. Sawada, Makoto Ishida:
Microscale temperature sensing using novel reliable silicon vertical microprobe array: Computation and experiment. Microelectron. Reliab. 55(12): 2689-2697 (2015)
2010
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Makoto Ishida, Takeshi Kawano, K. Sawada:
Smart microchips for intelligent sensing. INSS 2010: 1-5

1990 – 1999

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1992
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K. Sawada, S. Kayano:
An Evaluation of I_DDQ Versus Conventional Testing for CMOS Sea-of-Gate IC's. ITC 1992: 158-167
1990
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T. Tada, R. Takagi, S. Nakao, M. Hyozo, T. Arakawa, K. Sawada, M. Ueda:
A fine pitch probe technology for VLSI wafer testing. ITC 1990: 900-906

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