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Gaelle Beylier

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2010 – 2019

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2019
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Fatoumata Sy, Quentin Rafhay, Julien Poëtte, Gregory Grosa, C. Besset, Gaelle Beylier, Philippe Grosse, David Roy, Jean-Emmanuel Broquin:
Characterization and Modelling of High Speed Ge Photodetectors Reliability. IRPS 2019: 1-5

2000 – 2009

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2008
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Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo:
Impact of silicon nitride CESL on NLDEMOS transistor reliability. Microelectron. Reliab. 48(8-9): 1539-1543 (2008)
2007
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Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo:
Refined electrical analysis of two charge states transition characteristic of "borderless" silicon nitride. Microelectron. Reliab. 47(4-5): 743-747 (2007)

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