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ORCIDWim van Aarle
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- affiliation: University of Antwerp, Belgium
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2010 – 2019
- 2016
[j7]Folkert Bleichrodt, Tristan van Leeuwen
, Willem Jan Palenstijn, Wim van Aarle, Jan Sijbers, Kees Joost Batenburg:
Easy implementation of advanced tomography algorithms using the ASTRA toolbox with Spot operators. Numer. Algorithms 71(3): 673-697 (2016)- 2015
- [j6]Siegfried Cools, Pieter Ghysels, Wim van Aarle, Jan Sijbers, Wim Vanroose:
A multi-level preconditioned Krylov method for the efficient solution of algebraic tomographic reconstruction problems. J. Comput. Appl. Math. 283: 1-16 (2015) - [c4]Linda Plantagie, Wim van Aarle, Jan Sijbers, Kees Joost Batenburg:
Filtered backprojection using algebraic filters; application to biomedical micro-CT data. ISBI 2015: 1596-1599 - 2014
- [j5]Wim van Aarle, Kees Joost Batenburg, Gert Van Gompel, Elke Van de Casteele, Jan Sijbers:
Super-Resolution for Computed Tomography Based on Discrete Tomography. IEEE Trans. Image Process. 23(3): 1181-1193 (2014) - 2013
- [j4]Karim Zarei Zefreh, Wim van Aarle, Kees Joost Batenburg, Jan Sijbers:
Discrete algebraic reconstruction technique: a new approach for superresolution reconstruction of license plates. J. Electronic Imaging 22(4): 041111 (2013) - 2012
- [j3]Wim van Aarle, Kees Joost Batenburg, Jan Sijbers:
Automatic Parameter Estimation for the Discrete Algebraic Reconstruction Technique (DART). IEEE Trans. Image Process. 21(11): 4608-4621 (2012) - 2011
- [j2]Kees Joost Batenburg, Wim van Aarle, Jan Sijbers:
A semi-automatic algorithm for grey level estimation in tomography. Pattern Recognit. Lett. 32(9): 1395-1405 (2011) - [j1]Wim van Aarle, Kees Joost Batenburg, Jan Sijbers:
Optimal Threshold Selection for Segmentation of Dense Homogeneous Objects in Tomographic Reconstructions. IEEE Trans. Medical Imaging 30(4): 980-989 (2011) - 2010
- [c3]Gert Van Gompel, Kees Joost Batenburg, Elke Van de Casteele, Wim van Aarle, Jan Sijbers:
A discrete tomography approach for superresolution micro-CT images: application to bone. ISBI 2010: 816-819
2000 – 2009
- 2009
- [c2]Kees Joost Batenburg, Wim van Aarle, Jan Sijbers:
Grey Level Estimation for Discrete Tomography. DGCI 2009: 517-529 - 2008
- [c1]Wim van Aarle, Kees Joost Batenburg, Jan Sijbers:
Threshold Selection for Segmentation of Dense Objects in Tomograms. ISVC (1) 2008: 700-709
Coauthor Index
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