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Tsung-Yeh Li

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2010 – 2019

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2013
[j1]
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  dblp key:
  - journals/tvlsi/LiHHTHLMHBTWW13
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  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/LiHHTHLMHBTWW13
Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu:
AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 329-341 (2013)
2010
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  - conf/dft/LiHHTHLMHBWTW10
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  - https://dblp.org/rec/conf/dft/LiHHTHLMHBWTW10
Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Cheng-Wen Wu, Ching-Cheng Tien, Mike Wang:
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. DFT 2010: 340-348

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