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ORCIDDaisuke Ueda
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2010 – 2019
- 2019
[c5]Katsuyuki Akutsu, Susumu Seino, Yusuke Ogawa, Kenji Ohki, Atsushi Takahashi, Daisuke Ueda, Ryo Ogawa, Teppei Imamura, Akira Yoshikaie:
A compact retinal scan near-eye display. SIGGRAPH Emerging Technologies 2019: 2:1-2:2- 2014
- [c4]Shuichi Nagai, Yasuhiro Yamada, Noboru Negoro, Hiroyuki Handa, Yuji Kudoh, Hiroaki Ueno, Masahiro Ishida, Nobuyuki Otuska, Daisuke Ueda:
30.5 A GaN 3×3 matrix converter chipset with Drive-by-Microwave technologies. ISSCC 2014: 494-495 - 2013
- [c3]Toru Abe, Masaru Fukushi, Daisuke Ueda:
Primitive Human Action Recognition Based on Partitioned Silhouette Block Matching. ISVC (2) 2013: 308-317 - 2012
- [c2]Shuichi Nagai, Noboru Negoro, Takeshi Fukuda, Nobuyuki Otsuka, Hiroyuki Sakai, Tetsuzo Ueda
, Tsuyoshi Tanaka, Daisuke Ueda:
A DC-isolated gate drive IC with drive-by-microwave technology for power switching devices. ISSCC 2012: 404-406 - 2011
- [j5]Nicola Trivellin, Matteo Meneghini, Carlo De Santi, Simone Vaccari, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, S. Takigawa, Tsuyoshi Tanaka, Daisuke Ueda:
Degradation of InGaN lasers: Role of non-radiative recombination and injection efficiency. Microelectron. Reliab. 51(9-11): 1747-1751 (2011) - [c1]Tetsuzo Ueda, Tsuyoshi Tanaka, Daisuke Ueda:
Current status on GaN-based RF-power devices. ESSCIRC 2011: 61-66 - 2010
- [j4]Matteo Meneghini, Nicola Trivellin, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda, Enrico Zanoni, Gaudenzio Meneghesso:
Reliability evaluation for Blu-Ray laser diodes. Microelectron. Reliab. 50(4): 467-470 (2010)
2000 – 2009
- 2009
- [j3]Nicola Trivellin, Matteo Meneghini, Gaudenzio Meneghesso, Enrico Zanoni, Kenji Orita, Masaaki Yuri, Tsuyoshi Tanaka, Daisuke Ueda:
Reliability analysis of InGaN Blu-Ray laser diode. Microelectron. Reliab. 49(9-11): 1236-1239 (2009) - 2007
- [j2]Teruki Ishido, Hisayoshi Matsuo, Takuma Katayama, Tetsuzo Ueda, Kaoru Inoue, Daisuke Ueda:
Depth profiles of strain in AlGaN/GaN heterostructures grown on Si characterized by electron backscatter diffraction technique. IEICE Electron. Express 4(24): 775-781 (2007)
1990 – 1999
- 1996
- [j1]Haruhiko Koizumi, Atsushi Noma, Tsuyoshi Tanaka, Kunihiko Kanazawa, Daisuke Ueda:
A GaAs MMIC chip-set for mobile communications using on-chip ferroelectric capacitors. IEEE J. Solid State Circuits 31(6): 835-840 (1996)
Coauthor Index
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