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"Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor ..."

Tai Song et al. (2024)

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DOI: 10.1109/TCSII.2024.3362957

access: closed

type: Journal Article

metadata version: 2025-01-19

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Tai Song, Zhengfeng Huang, Li Zhang, Qi Hong, Zhao Yang, Milos Krstic:
Test Cost Reduction for VLSI Adaptive Test With K-Nearest Neighbor Classification Algorithm. IEEE Trans. Circuits Syst. II Express Briefs 71(7): 3508-3512 (2024)

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