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Sravan Kumar Bhaskarani

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2000 – 2009

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2007
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Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
Built in Defect Prognosis for Embedded Memories. DDECS 2007: 167-172
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Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
GALS Based Shared Test Architecture for Embedded Memories. ISCAS 2007: 157-160
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Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskarani:
Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. ISVLSI 2007: 171-178

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