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Yieng-Chiang Wu

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2000 – 2009

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2009
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  - https://dblp.org/rec/journals/eswa/LinHLWWL09
Chern-Sheng Lin, Kuo-Hon Huang, Yun-Long Lay, Kuo-Chun Wu, Yieng-Chiang Wu, Jim-Min Lin:
An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process. Expert Syst. Appl. 36(2): 3234-3239 (2009)

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