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N. H. Niu

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2006
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  - https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06
J. F. Luo, Yuan Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen:
EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectron. Reliab. 46(1): 178-182 (2006)

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