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ORCIDDaniel D. Frey
Person information
- affiliation: Massachusetts Institute of Technology (MIT), Department of Mechanical Engineering, Cambridge, MA, USA
Other persons with the same name
- Daniel Frey — disambiguation page
- Daniel Frey 0002 — University of Karlsruhe, Institute for Process Control and Robotics, Germany
- Daniel Frey 0003 — Technical University of Munich, School of Engineering and Design, Germany
Other persons with a similar name
- Dániel Frey
- Daniel R. Frey — Orbit Advanced Technologies, Warminster, PA, USA
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2010 – 2019
- 2017
[c6]Amit Gandhi, Daniel Frey, Prithvi Sundar, Julia Heyman, Matt McCambridge:
Design of a cellular-enabled data-logging system for wheelchair use characterization. GHTC 2017: 1-4- 2016
- [c5]Prithiviraj Sundararaman, Amit Gandhi, Daniel Frey, Acuku Helen Ekolu, Betty Ikalany, Megha Hegde, Kendra Leith, Daniel J. Sweeney:
Measuring usage and adoption of improved cookstoves in ugandan households using quantitative and qualitative methods. GHTC 2016: 136-142 - [c4]Amit Gandhi, Victor Lesniewski, Daniel Frey:
Assessing solar lantern usage in Uganda through qualitative and sensor-based methods. GHTC 2016: 520-524 - 2015
- [j13]Nagarajan Raghavan
, Daniel D. Frey:
Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms. Microelectron. Reliab. 55(9-10): 1297-1301 (2015) - [j12]Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey:
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. Microelectron. Reliab. 55(9-10): 1422-1426 (2015) - [c3]Nagarajan Raghavan, Daniel D. Frey:
Remaining useful life estimation for systems subject to multiple degradation mechanisms. ICPHM 2015: 1-8 - [c2]Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey:
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. IRPS 2015: 5 - 2014
- [j11]Daniela Faas, Qifang Bao, Daniel D. Frey, Maria C. Yang:
The influence of immersion and presence in early stage engineering designing and building. Artif. Intell. Eng. Des. Anal. Manuf. 28(2): 139-151 (2014) - [j10]Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey:
Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. Microelectron. Reliab. 54(9-10): 1729-1734 (2014) - [j9]Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey:
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. Microelectron. Reliab. 54(9-10): 2266-2271 (2014) - 2013
- [j8]Daniel D. Frey:
Comment: Dimensional Analysis and Experimentation as a Catalyst to Learning From Data. Technometrics 55(3): 275-278 (2013) - [c1]Amelia Tepper Servi, Peter Kyungchul Kang, Daniel Frey, Susan Murcott:
A holistic optimization framework for improving ceramic pot filter performance. GHTC 2013: 355-360 - 2011
- [j7]Nandan Sudarsanam, Daniel D. Frey:
Using ensemble techniques to advance adaptive one-factor-at-a-time experimentation. Qual. Reliab. Eng. Int. 27(7): 947-957 (2011) - [e1]Daniel D. Frey, Shuichi Fukuda, Georg Rock:
Improving Complex Systems Today, Proceedings of the 18th ISPE International Conference on Concurrent Engineering, July 4-8, 2011, Boston, MA, USA. Springer 2011, ISBN 978-0-85729-798-3 [contents] - 2010
- [j6]Daniel Frey, William P. Birmingham, Clive L. Dym:
Design pedagogy: Representations and processes. Artif. Intell. Eng. Des. Anal. Manuf. 24(3): 283-284 (2010)
2000 – 2009
- 2007
- [j5]Jagmeet Singh, Daniel D. Frey, Nathan Soderborg, Rajesh Jugulum:
Compound Noise: Evaluation as a Robust Design Method. Qual. Reliab. Eng. Int. 23(3): 387-398 (2007) - [j4]Daniel Frey, Joseph Palladino, John Sullivan, Malvern Atherton:
Part count and design of robust systems. Syst. Eng. 10(3): 203-221 (2007) - 2006
- [j3]Xiang Li, Nandan Sudarsanam, Daniel D. Frey:
Regularities in data from factorial experiments. Complex. 11(5): 32-45 (2006) - [j2]Daniel D. Frey, Hungjen Wang:
Adaptive One-Factor-at-a-Time Experimentation and Expected Value of Improvement. Technometrics 48(3): 418-431 (2006) - 2005
- [j1]Don Clausing, Daniel D. Frey:
Improving system reliability by failure-mode avoidance including four concept design strategies. Syst. Eng. 8(3): 245-261 (2005)
Coauthor Index
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