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A. Dehbi

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2000 – 2009

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2006
[j4]
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  dblp key:
  - journals/mr/KriegerWDBOL06
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  - https://dblp.org/rec/journals/mr/KriegerWDBOL06
V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier:
Defect detection in multilayer ceramic capacitors. Microelectron. Reliab. 46(9-11): 1926-1931 (2006)
2005
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  - journals/mr/PostLBHSSWOLD05
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H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi:
Failure mechanisms and qualification testing of passive components. Microelectron. Reliab. 45(9-11): 1626-1632 (2005)
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A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak:
Vibration lifetime modelling of PCB assemblies using steinberg model. Microelectron. Reliab. 45(9-11): 1658-1661 (2005)
2002
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A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto:
High temperature reliability testing of aluminum and tantalum electrolytic capacitors. Microelectron. Reliab. 42(6): 835-840 (2002)

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