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ORCIDThomas Y. Hoffmann
Person information
- affiliation: IMEC, Leuven, Belgium
- affiliation (PhD 2000): Lille University, Villeneuve d'Ascq, France
Other persons with a similar name
- Thomas J. Hoffmann — University of California San Francisco, Department of Epidemiology and Biostatistics / Institute for Human Genetics, CA, USA
- Thomas K. Hoffmann
- Thomas Hoffmann-Walbeck
- Thomas Hoffmann 0001 (aka: Thomas R. Hoffmann, Thomas Russell Hoffmann) — University of Minnesota Twin Cities, Minneapolis, MN, USA (and 5 more)
- Thomas Hoffmann 0002 — Otto-von-Guericke University, Institute of Neuroradiology, Magdeburg, Germany
- Thomas Hoffmann 0003 — Leipzig University, Institute of Computer Science, Germany
- Thomas Hoffmann 0004
![[0000-0002-2980-8324]](https://dblp.org/img/orcid-mark.12x12.png "0000-0002-2980-8324")
— TU Munich, Department of Biosciences, Germany - Thomas Hoffmann 0005 — Tallinn University of Technology, Tallinn Law School, Estonia
- Thomas Hoffmann Kilbak
- Djeisson Hoffmann Thomas
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2010 – 2019
- 2012
[j1]Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling. IEEE Trans. Very Large Scale Integr. Syst. 20(8): 1487-1495 (2012)- 2011
- [c2]Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252
2000 – 2009
- 2009
- [c1]Thomas Chiarella, Liesbeth Witters, Abdelkarim Mercha, Christoph Kerner, Rok Dittrich, Michal Rakowski, Claude Ortolland, Lars-Åke Ragnarsson, Bertrand Parvais, An De Keersgieter, Stefan Kubicek, Augusto Redolfi, R. Rooyackers, C. Vrancken, S. Brus, A. Lauwers, Philippe Absil, S. Biesemans, Thomas Y. Hoffmann:
Migrating from planar to FinFET for further CMOS scaling: SOI or bulk? ESSCIRC 2009: 84-87
Coauthor Index
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