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2020 – today
- 2024
[j8]Daniel Gil-Tomas
, Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
A Hybrid Technique Based on ECC and Hardened Cells for Tolerating Random Multiple-Bit Upsets in SRAM Arrays. IEEE Access 12: 70662-70675 (2024)- [c14]Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid, Joaquin Gracia-Moran:
Zero-Space In-Weight and In-Bias Protection for Floating-Point-based CNNs. EDCC 2024: 89-96 - [c13]Joaquin Gracia-Moran, Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid:
Allocating ECC parity bits into BF16-encoded CNN parameters: A practical experience report. LADC 2024: 75-80 - [c12]Juan Carlos Ruiz, David de Andrés, Luis J. Saiz-Adalid, Joaquin Gracia-Moran:
In-Memory Zero-Space Floating-Point-Based CNN Protection Using Non-significant and Invariant Bits. SAFECOMP 2024: 3-17
2010 – 2019
- 2019
- [j7]Luis J. Saiz-Adalid, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection. IEEE Access 7: 151131-151143 (2019) - 2018
- [j6]Joaquin Gracia-Moran, Luis J. Saiz-Adalid, Daniel Gil-Tomas, Pedro J. Gil-Vicente:
Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications. IEEE Trans. Very Large Scale Integr. Syst. 26(10): 2132-2142 (2018) - [c11]Joaquin Gracia-Moran, Luis J. Saiz-Adalid, Juan-Carlos Baraza-Calvo, Pedro J. Gil:
Correction of Adjacent Errors with Low Redundant Matrix Error Correction Codes. LADC 2018: 107-114 - 2016
- [j5]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System. IEEE Trans. Reliab. 65(2): 648-661 (2016) - [c10]Luis J. Saiz-Adalid, Pedro J. Gil, Juan Carlos Ruiz, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo:
Ultrafast Error Correction Codes for Double Error Detection/Correction. EDCC 2016: 108-119 - 2015
- [j4]Luis J. Saiz-Adalid, Pedro Reviriego, Pedro J. Gil, Salvatore Pontarelli, Juan Antonio Maestro:
MCU Tolerance in SRAMs Through Low-Redundancy Triple Adjacent Error Correction. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2332-2336 (2015) - [c9]Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan-Carlos Baraza-Calvo:
Ultrafast Single Error Correction Codes for Protecting Processor Registers. EDCC 2015: 144-154 - 2014
- [j3]Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Effects of Intermittent Faults on the Reliability of a Reduced Instruction Set Computing (RISC) Microprocessor. IEEE Trans. Reliab. 63(1): 144-153 (2014) - [c8]Luis J. Saiz-Adalid, Pedro J. Gil, Juan-Carlos Baraza-Calvo, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Joaquin Gracia-Moran:
Modified Hamming Codes to Enhance Short Burst Error Detection in Semiconductor Memories (Short Paper). EDCC 2014: 62-65 - 2013
- [c7]Luis J. Saiz-Adalid, Pedro J. Gil, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo:
Using Interleaving to Avoid the Effects of Multiple Adjacent Faults in On-Chip Interconnection Lines. EWDC 2013: 198-201 - [c6]Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan-Carlos Baraza-Calvo, Pedro J. Gil-Vicente:
Defining a Representative and Low Cost Fault Model Set for Intermittent Faults in Microprocessor Buses. LADC 2013: 98-103 - [c5]Luis J. Saiz-Adalid, Pedro J. Gil-Vicente, Juan-Carlos Ruiz-Garcia, Daniel Gil-Tomas, Juan Carlos Baraza, Joaquin Gracia-Moran:
Flexible Unequal Error Control Codes with Selectable Error Detection and Correction Levels. SAFECOMP 2013: 178-189 - 2012
- [j2]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Analyzing the Impact of Intermittent Faults on Microprocessors Applying Fault Injection. IEEE Des. Test 29(6): 66-73 (2012) - [j1]Daniel Gil-Tomas, Joaquin Gracia-Moran, Juan-Carlos Baraza-Calvo, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Studying the effects of intermittent faults on a microcontroller. Microelectron. Reliab. 52(11): 2837-2846 (2012) - 2010
- [c4]Joaquin Gracia-Moran, Daniel Gil-Tomas, Luis J. Saiz-Adalid, Juan Carlos Baraza, Pedro J. Gil-Vicente:
Experimental validation of a fault tolerant microcomputer system against intermittent faults. DSN 2010: 413-418 - [c3]Joaquin Gracia-Moran, Daniel Gil-Tomas, Juan Carlos Baraza, Luis J. Saiz-Adalid, Pedro J. Gil-Vicente:
Searching Representative and Low Cost Fault Models for Intermittent Faults in Microcontrollers: A Case Study. PRDC 2010: 11-18
2000 – 2009
- 2008
- [c2]Joaquin Gracia, Luis J. Saiz, Juan Carlos Baraza, Daniel Gil, Pedro J. Gil:
Analysis of the influence of intermittent faults in a microcontroller. DDECS 2008: 80-85 - [c1]Daniel Gil, Luis J. Saiz, Joaquin Gracia, Juan Carlos Baraza, Pedro J. Gil:
Injecting intermittent faults for the dependability validation of commercial microcontrollers. HLDVT 2008: 177-184
Coauthor Index
aka: Juan-Carlos Baraza-Calvo
aka: Daniel Gil-Tomas
aka: Pedro J. Gil-Vicente
aka: Joaquin Gracia-Moran
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