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ORCIDA. Meinertzhagen
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2000 – 2009
- 2005
[j5]Christian Petit, A. Meinertzhagen, Damien Zander, O. Simonetti, M. Fadlallah, T. Maurel:
Low voltage SILC and P- and N-MOSFET gate oxide reliability. Microelectron. Reliab. 45(3-4): 479-485 (2005)- 2003
- [j4]M. Fadlallah, C. Petit, A. Meinertzhagen, Gérard Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader:
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices. Microelectron. Reliab. 43(9-11): 1433-1438 (2003) - [j3]Damien Zander, F. Saigné, A. Meinertzhagen, Christian Petit:
Contribution of oxide traps on defect creation and LVSILC conduction in ultra thin gate oxide devices. Microelectron. Reliab. 43(9-11): 1489-1493 (2003) - 2001
- [j2]Damien Zander, Christian Petit, F. Saigné, A. Meinertzhagen:
High field stress at and above room temperature in 2.3 nm thick oxides. Microelectron. Reliab. 41(7): 1023-1026 (2001) - [j1]D. Zander, F. Saigné, A. Meinertzhagen:
Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides. Microelectron. Reliab. 41(9-10): 1355-1360 (2001)
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