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2020 – today
- 2022
[j22]Mengyun Liu, Xin Li, Krishnendu Chakrabarty
, Xinli Gu:
Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(3): 762-775 (2022)- [j21]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2170-2184 (2022) - 2021
- [j20]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(2): 386-399 (2021) - [j19]Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Identification Using Streaming Data. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(9): 1920-1933 (2021) - 2020
- [j18]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(3): 700-713 (2020) - [j17]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Self-Learning and Efficient Health-Status Analysis for a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(9): 1935-1948 (2020) - [j16]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-grained Adaptive Testing Based on Quality Prediction. ACM Trans. Design Autom. Electr. Syst. 25(5): 38:1-38:25 (2020) - [c49]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Unsupervised Root-Cause Analysis for Integrated Systems. ITC 2020: 1-10
2010 – 2019
- 2019
- [j15]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Anomaly Detection and Health-Status Analysis in a Core Router System. IEEE Des. Test 36(5): 7-17 (2019) - [j14]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(7): 1331-1344 (2019) - [c48]Mengyun Liu, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation. ITC 2019: 1-10 - [c47]Mengyun Liu, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Identification using Streaming Data. VTS 2019: 1-6 - [c46]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. VTS 2019: 1-6 - [c45]Ghada Sokar, Yassin Zakaria, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos:
IP Session on Machine Learning Applications in IC Test-Related Tasks. VTS 2019: 1 - 2018
- [j13]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2111-2124 (2018) - [c44]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Failure prediction based on anomaly detection for complex core routers. ICCAD 2018: 49 - [c43]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Self-Learning Health-Status Analysis for a Core Router System. ITC 2018: 1-10 - [c42]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-Grained Adaptive Testing Based on Quality Prediction. ITC 2018: 1-10 - 2017
- [c41]Ting Wang, Yannan Liu, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu:
RetroDMR: Troubleshooting non-deterministic faults with retrospective DMR. DATE 2017: 638-641 - [c40]Tong Guan, Zhaobo Zhang, Wen Dong, Chunming Qiao, Xinli Gu:
Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. ETS 2017: 1-6 - [c39]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Changepoint-based anomaly detection in a core router system. ITC 2017: 1-10 - [c38]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Symbol-based health-status analysis in a core router system. ITC 2017: 1-10 - 2016
- [j12]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(2): 323-336 (2016) - [j11]Shi Jin, Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(6): 985-998 (2016) - [c37]Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Accurate anomaly detection using correlation-based time-series analysis in a core router system. ITC 2016: 1-10 - 2015
- [j10]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(6): 1014-1026 (2015) - [c36]Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu:
Self-learning and adaptive board-level functional fault diagnosis. ASP-DAC 2015: 294-301 - [c35]Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu:
On test syndrome merging for reasoning-based board-level functional fault diagnosis. ASP-DAC 2015: 737-742 - 2014
- [j9]Fangming Ye, Krishnendu Chakrabarty, Zhaobo Zhang, Xinli Gu:
Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis. IEEE Des. Test 31(3): 65-75 (2014) - [j8]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(2): 279-290 (2014) - [c34]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. ITC 2014: 1-10 - [c33]Jacob A. Abraham, Xinli Gu, Teresa MacLaurin, Janusz Rajski, Paul G. Ryan, Dimitris Gizopoulos, Matteo Sonza Reorda:
Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? VTS 2014: 1-2 - 2013
- [j7]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(5): 723-736 (2013) - [c32]Fangming Ye, Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. Asian Test Symposium 2013: 73-78 - [c31]Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman:
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS 2013: 1 - [c30]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. ETS 2013: 1-6 - [c29]Zelong Sun, Li Jiang, Qiang Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu:
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures. ITC 2013: 1-8 - 2012
- [j6]Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu:
Reproduction and Detection of Board-Level Functional Failure. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(4): 630-643 (2012) - [j5]Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu:
Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(10): 1586-1599 (2012) - [j4]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Physical-Defect Modeling and Optimization for Fault-Insertion Test. IEEE Trans. Very Large Scale Integr. Syst. 20(4): 723-736 (2012) - [c28]Xinli Gu:
Session Summary II: Dependable VLSI for Product Reliability. Asian Test Symposium 2012: 67 - [c27]Yu Hu, Xinli Gu, Xiaowei Li:
In-Field Testing of NAND Flash Storage: Why and How? Asian Test Symposium 2012: 69 - [c26]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. Asian Test Symposium 2012: 202-207 - [c25]Fangming Ye, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. Asian Test Symposium 2012: 208-213 - [c24]Xinli Gu:
Session Summary V: Is Component Interconnection Test Enough for Board or System Test. Asian Test Symposium 2012: 270 - [c23]Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson:
Re-using chip level DFT at board level. ETS 2012: 1 - [c22]Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty:
Diagnostic system based on support-vector machines for board-level functional diagnosis. ETS 2012: 1-6 - [c21]Xinli Gu:
Are industrial test problems real problems? I thought research has resolved them all! ITC 2012: 1 - 2011
- [c20]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty:
Deterministic test for the reproduction and detection of board-level functional failures. ASP-DAC 2011: 491-496 - [c19]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty:
Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. ETS 2011: 195-200 - [c18]Xinli Gu:
The gap: Test challenges in Asia manufacturing field. ITC 2011: 1 - [c17]Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu:
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. ITC 2011: 1-9 - 2010
- [c16]Hongxia Fang, Zhiyuan Wang, Xinli Gu, Krishnendu Chakrabarty:
Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. Asian Test Symposium 2010: 421-428 - [c15]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. Asian Test Symposium 2010: 429-432 - [c14]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Board-level fault diagnosis using an error-flow dictionary. ITC 2010: 485-494 - [c13]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Board-level fault diagnosis using Bayesian inference. VTS 2010: 244-249
2000 – 2009
- 2009
- [c12]Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty:
Physical defect modeling for fault insertion in system reliability test. ITC 2009: 1-10 - 2008
- [j3]Laung-Terng Wang, Xiaoqing Wen, Shianling Wu, Zhigang Wang, Zhigang Jiang, Boryau Sheu, Xinli Gu:
VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. IEEE Des. Test Comput. 25(2): 122-130 (2008) - 2006
- [c11]Toai Vo, Zhiyuan Wang, Ted Eaton, Pradipta Ghosh, Huai Li, Young Lee, Weili Wang, Hong Shin Jun, Rong Fang, Dan Singletary, Xinli Gu:
Design for Board and System Level Structural Test and Diagnosis. ITC 2006: 1-10 - 2005
- [c10]Zoe Conroy, Geoff Richmond, Xinli Gu, Bill Eklow:
A practical perspective on reducing ASIC NTFs. ITC 2005: 7 - 2004
- [c9]Heon C. Kim, Hong Shin Jun, Xinli Gu, Sung Soo Chung:
At-Speed Interconnect Test and Diagnosis of External Memories on a System. ITC 2004: 156-162 - [c8]Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533 - 2002
- [c7]Xinli Gu, Weili Wang, Kevin Li, Heon C. Kim, Sung Soo Chung:
Re-Using DFT Logic for Functional and Silicon Debugging Test. ITC 2002: 648-656 - 2001
- [c6]Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian:
An effort-minimized logic BIST implementation method. ITC 2001: 1002-1010
1990 – 1999
- 1998
- [c5]Mokhtar Hirech, James Beausang, Xinli Gu:
A new approach to scan chain reordering using physical design information. ITC 1998: 348-355 - 1997
- [c4]Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng:
A controller testability analysis and enhancement technique. ED&TC 1997: 153-157 - 1995
- [c3]Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
An Efficient and Economic Partitioning Approach for Testability. ITC 1995: 403-412 - [c2]Xinli Gu:
RT level testability-driven partitioning. VTS 1995: 176-183 - 1994
- [c1]Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
Testability analysis and improvement from VHDL behavioral specifications. EURO-DAC 1994: 644-649 - 1992
- [j2]Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
An approach to testability analysis and improvement for VLSI systems. Microprocess. Microprogramming 35(1-5): 485-492 (1992) - 1991
- [j1]Xinli Gu, Krzysztof Kuchcinski, Zebo Peng:
Testability measure with reconvergent fanout analysis and its applications. Microprocessing and Microprogramming 32(1-5): 835-842 (1991)
Coauthor Index
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