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Rashid Amine

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2000 – 2009

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2005
[j1]
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  dblp key:
  - journals/et/GyvezGA05
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  persistent URL:
  - https://dblp.org/rec/journals/et/GyvezGA05
José Pineda de Gyvez, Guido Gronthoud, Rashid Amine:
Multi-VDD Testing for Analog Circuits. J. Electron. Test. 21(3): 311-322 (2005)
2003
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  - conf/itc/GyvezGA03
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José Pineda de Gyvez, Guido Gronthoud, Rashid Amine:
VDD Ramp Testing for RF Circuits. ITC 2003: 651-658

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