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Takuya Sawada
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2020 – today
- 2023
- [j5]Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo, Takuji Miki, Makoto Nagata:
Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging. IEICE Trans. Electron. 106(10): 556-564 (2023) - [c5]Takuya Sawada, Takafumi Katayama, Tian Song, Takashi Shimamoto:
Semi-Supervised Learning Based De-Raining Method for UAV. ICCE 2023: 1-5 - 2022
- [c4]Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Takuji Miki, Makoto Nagata, Kikuo Muramatsu, Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo:
Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging. IRPS 2022: 14-1
2010 – 2019
- 2019
- [c3]Yoshiko Maruyama, Takuya Sawada, Kenji Moriya:
Character input system based on EMG signals generated by eye blinks. ACIT 2019: 7:1-7:6 - 2015
- [j4]Takuya Sawada, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata:
An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference. IEEE Trans. Very Large Scale Integr. Syst. 23(10): 2347-2351 (2015) - 2014
- [j3]Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto:
A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation. IEICE Trans. Electron. 97-C(4): 332-341 (2014) - [c2]Kensaku Fujii, Mitsuji Muneyasu, Takuya Sawada, Takuto Yoshioka, Masakazu Morimoto:
An insertion loss control method for supplementing cancellation effect deteriorated by echo path change in hands free telecommunication system. APCCAS 2014: 439-442 - [c1]Yohei Nakata, Yuta Kimi, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa, Makoto Nagata, Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai, Hiroshi Kawaguchi, Masahiko Yoshimoto:
A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. ISQED 2014: 16-23 - 2013
- [j2]Takuto Yoshioka, Kana Yamasaki, Takuya Sawada, Kensaku Fujii, Mitsuji Muneyasu, Masakazu Morimoto:
A Step Size Control Method Improving Estimation Speed in Double Talk Term. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 96-A(7): 1543-1551 (2013) - 2012
- [j1]Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa, Hidehiro Takata, Koji Nii, Makoto Nagata:
Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. IEICE Trans. Electron. 95-C(4): 586-593 (2012) - 2011
- [i1]Shunsuke Okumura, Takuya Sawada, Paul H. Kyzivat:
Session Initiation Protocol (SIP) Usage of the Offer/Answer Model. RFC 6337: 1-33 (2011)
Coauthor Index
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