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Jan Arild Tofte

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2000 – 2009

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2004
[c3]
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Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533
2001
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Xinli Gu, Sung Soo Chung, Frank Tsang, Jan Arild Tofte, Hamid Rahmanian:
An effort-minimized logic BIST implementation method. ITC 2001: 1002-1010
2000
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Jan Arild Tofte, Chee-Kian Ong, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng:
Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test. VTS 2000: 237-246

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