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ORCIDValery A. Vardanian
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2010 – 2019
- 2019
[c29]Karen Amirkhanyan, Valery A. Vardanian:
On a Method for Segmentation of Memory Instances with Row Redundancies. EWDTS 2019: 1-5- 2015
- [c28]Vrezh Sargsyan, Valery A. Vardanian, Samvel K. Shoukourian, Yervant Zorian, Avetik Yessayan:
An efficient approach for memory repair by reducing the number of spares. EWDTS 2015: 1-4 - 2014
- [c27]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Extending fault periodicity table for testing faults in memories under 20nm. EWDTS 2014: 1-4 - [c26]Gurgen Harutyunyan, Grigor Tshagharyan, Valery A. Vardanian, Yervant Zorian:
Fault modeling and test algorithm creation strategy for FinFET-based memories. VTS 2014: 1-6 - 2013
- [c25]K. Amirkhanyan, A. Davtyan, Gurgen Harutyunyan, T. Melkumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Application of defect injection flow for fault validation in memories. EWDTS 2013: 1-4 - [c24]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Impact of process variations on read failures in SRAMs. EWDTS 2013: 1-4 - [c23]T. Melkumyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters. EWDTS 2013: 1-4 - [c22]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An effective solution for building memory BIST infrastructure based on fault periodicity. VTS 2013: 1-6 - 2012
- [j5]Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(6): 941-949 (2012) - 2011
- [j4]Gurgen Harutunyan, Aram Hakhumyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Symmetry Measure for Memory Test and Its Application in BIST Optimization. J. Electron. Test. 27(6): 753-766 (2011) - [c21]K. Darbinyan, Gurgen Harutyunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Robust Solution for Embedded Memory Test and Repair. Asian Test Symposium 2011: 461-462 - [c20]Hayk T. Grigoryan, Gurgen Harutunyan, Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
Generic BIST architecture for testing of content addressable memories. IOLTS 2011: 86-91 - 2010
- [c19]H. Avetisyan, Gurgen Harutyunyan, Valery A. Vardanian, Yervant Zorian:
An efficient March test for detection of all two-operation dynamic faults from subclass Sav. EWDTS 2010: 310-313
2000 – 2009
- 2008
- [c18]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories. VTS 2008: 95-100 - 2007
- [j3]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories. J. Electron. Test. 23(1): 55-74 (2007) - [c17]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
A March-based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories. DDECS 2007: 145-148 - 2006
- [c16]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories. DDECS 2006: 262-267 - [c15]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Dynamic Faults in Random Access Memories. ETS 2006: 43-48 - [c14]T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian:
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. MTDT 2006: 9-14 - [c13]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories. VTS 2006: 120-127 - 2005
- [c12]Yervant Zorian, Valery A. Vardanian, K. Aleksanyan, K. Amirkhanyan:
Impact of Soft Error Challenge on SoC Design. IOLTS 2005: 63-68 - [c11]Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian:
Minimal March Tests for Unlinked Static Faults in Random Access Memories. VTS 2005: 53-59 - 2004
- [j2]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. IEEE Des. Test Comput. 21(3): 200-207 (2004) - [c10]N. Derhacobian, Valery A. Vardanian, Yervant Zorian:
Embedded Memory Reliability: The SER Challenge. MTDT 2004: 104-110 - [c9]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
A Methodology for Design and Evaluation of Redundancy Allocation Algorithms. VTS 2004: 249-260 - 2002
- [c8]Valery A. Vardanian, Yervant Zorian:
A March-Based Fault Location Algorithm for Static Random Access Memories. IOLTW 2002: 256-261 - [c7]Valery A. Vardanian, Yervant Zorian:
A March-Based Fault Location Algorithm for Static Random Access Memories. MTDT 2002: 62-67 - 2001
- [c6]Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
An Approach for Evaluation of Redunancy Analysis Algorithms. MTDT 2001: 51- - 2000
- [c5]Valery A. Vardanian, Liana B. Mirzoyan:
Improving the Error Detection Ability of Concurrent Checkers by Observation Point Insertion in the Circuit Under Check. DATE 2000: 762
1990 – 1999
- 1997
- [c4]Valery A. Vardanian:
Exact probabilistic analysis of error detection for parity checkers. VTS 1997: 222-229 - 1996
- [c3]Valery A. Vardanian:
On completely robust path delay fault testable realization of logic functions. VTS 1996: 302-307 - 1994
- [j1]Valery A. Vardanian:
On the Complexity of Dynamic Tests for Logic Functions. Acta Cybern. 11(4): 333-343 (1994) - [c2]Valery A. Vardanian:
On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions. VTS 1994: 182-185
1980 – 1989
- 1985
- [c1]Valery A. Vardanian:
On the length of single dynamic tests for monotone Boolean functions. FCT 1985: 442-449
Coauthor Index
aka: Gurgen Harutyunyan
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