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G. Cassanelli

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2000 – 2009

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2008
[j5]
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Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi:
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48(8-9): 1208-1211 (2008)
2006
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G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano:
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46(9-11): 1795-1799 (2006)
2005
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G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini:
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005)
2004
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Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi:
Failure Analysis of RuO₂ Thick Film Chip Resistors. Microelectron. Reliab. 44(9-11): 1763-1767 (2004)
2003
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G. Cassanelli, Fausto Fantini, G. Serra, S. Sgatti:
Reliability in automotive electronics: a case study applied to diesel engine control. Microelectron. Reliab. 43(9-11): 1411-1416 (2003)

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