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Seung-Kuk Kang

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2005
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Yoon-Jong Song, Heung-Jin Joo, Seung-Kuk Kang, Hyun-Ho Kim, Jung-Hoon Park, Y. M. Kang, E. Y. Kang, Sung-Young Lee, Kinam Kim:
Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. Microelectron. Reliab. 45(7-8): 1150-1153 (2005)

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