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2010 – 2019
- 2018
[j2]Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang
:
Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning. J. Electron. Test. 34(3): 337-349 (2018)- 2015
- [c15]John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li:
Fast deployment of alternate analog test using Bayesian model fusion. DATE 2015: 1030-1035 - [c14]Athanasios Dimakos, Martin Andraud, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu, Salvador Mir:
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors. ISVLSI 2015: 627 - 2014
- [c13]Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Low-cost EVM built-in test of RF transceivers. IDT 2014: 51-54 - [c12]Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - 2013
- [c11]Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur:
Multivariate statistical techniques for analog parametric test metrics estimation. DTIS 2013: 6-11 - [c10]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
True non-intrusive sensors for RF built-in test. ITC 2013: 1-10 - [c9]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet:
Defect-oriented non-intrusive RF test using on-chip temperature sensors. VTS 2013: 1-6 - 2012
- [c8]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet:
Testing RF circuits with true non-intrusive built-in sensors. DATE 2012: 1090-1095 - [c7]Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler:
Accurate estimation of analog test metrics with extreme circuits. ICECS 2012: 272-275 - [c6]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
Experiences with non-intrusive sensors for RF built-in test. ITC 2012: 1-8 - 2011
- [j1]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
RF Front-End Test Using Built-in Sensors. IEEE Des. Test Comput. 28(6): 76-84 (2011) - [c5]Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium 2011: 365-370 - [c4]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Implicit test of high-speed analog circuits using non-intrusive sensors. ECCTD 2011: 652 - 2010
- [c3]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir:
Sensors for built-in alternate RF test. ETS 2010: 49-54 - [c2]Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni:
Adaptive Logical Control of RF LNA Performances for Efficient Energy Consumption. VLSI-SoC (Selected Papers) 2010: 43-68 - [c1]Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni:
Adaptive logical control of RF LNA performances for efficient energy consumption. VLSI-SoC 2010: 161-166
Coauthor Index
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