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Masahiko Niwayama

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2016
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Osamu Kusumoto, Atsushi Ohoka, Nobuyuki Horikawa, Kohtaro Tanaka, Masahiko Niwayama, Masao Uchida, Yoshihiko Kanzawa, Kazuyuki Sawada, Tetsuzo Ueda:
Reliability of Diode-Integrated SiC Power MOSFET(DioMOS). Microelectron. Reliab. 58: 158-163 (2016)

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