default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDWilfrid Claeys
Person information
SPARQL queries 
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2014
[j16]Josep Altet
, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà:
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers. Microelectron. J. 45(5): 484-490 (2014)
2000 – 2009
- 2009
- [j15]Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire:
Joule expansion imaging techniques on microlectronic devices. Microelectron. J. 40(9): 1367-1372 (2009) - 2008
- [j14]Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire:
Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues. Microelectron. Reliab. 48(2): 204-211 (2008) - [c2]Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire:
Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. ETS 2008: 47-52 - 2006
- [j13]Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire:
Time gating imaging through thick silicon substrate: a new step towards backside characterisation. Microelectron. Reliab. 46(9-11): 1520-1524 (2006) - [j12]Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio:
Dynamic Surface Temperature Measurements in ICs. Proc. IEEE 94(8): 1519-1533 (2006) - 2005
- [j11]Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire:
ElectroStatic Discharge Fault Localization by Laser Probing. Microelectron. Reliab. 45(9-11): 1482-1486 (2005) - 2004
- [j10]Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz:
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. Microelectron. J. 35(10): 797-803 (2004) - [j9]Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale:
Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. Microelectron. J. 35(10): 811-816 (2004) - [j8]Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby:
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44(1): 95-103 (2004) - [j7]Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys:
Strain energy imaging of a power MOS transistor using speckle interferometry. IEEE Trans. Reliab. 53(2): 293-296 (2004) - 2003
- [j6]Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys:
Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectron. Reliab. 43(9-11): 1609-1613 (2003) - [j5]G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys:
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectron. Reliab. 43(9-11): 1803-1807 (2003) - 2001
- [j4]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal coupling in integrated circuits: application to thermal testing. IEEE J. Solid State Circuits 36(1): 81-91 (2001) - [j3]Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys:
Laser diode COFD analysis by thermoreflectance microscopy. Microelectron. Reliab. 41(9-10): 1597-1601 (2001) - 2000
- [c1]Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys:
Thermal Testing: Fault Location Strategies. VTS 2000: 189-194
1990 – 1999
- 1999
- [j2]Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto:
Differential Thermal Testing: An Approach to its Feasibility. J. Electron. Test. 14(1-2): 57-66 (1999) - [j1]Véronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys:
Temperature measurements of metal lines under current stress by high-resolution laser probing. IEEE Trans. Instrum. Meas. 48(1): 69-74 (1999)
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-04-25 05:45 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
